Inventor

LENGWEILER PATRIK

CH3 patents

Patents

3 patents

US12085378B2Sep 10, 2024

Surveying system and auxiliary measuring device

LEICA GEOSYSTEMS AG6 citations83

US12085379B2Sep 10, 2024

Surveying system and auxiliary measuring instrument

LEICA GEOSYSTEMS AG1 citations59

US9638522B2May 2, 2017

Total station having scanning functionality and selectable scanning modes

LEICA GEOSYSTEMS AG1 citations44