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Inventor
KRIST JOUKE
NL
2 patents
⚠️ This page may combine multiple inventors who share the name “KRIST JOUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DEN BOEF ARIE JEFFREY
1 patent
US8868387B2
Oct 21, 2014
Method of optimizing a model, a method of measuring a property, a device manufacturing method, a spectrometer and a lithographic apparatus
DEN BOEF ARIE JEFFREY
28 citations
89
ASML NETHERLANDS BV
1 patent
US9518936B2
Dec 13, 2016
Method and apparatus for determining lithographic quality of a structure
ASML NETHERLANDS BV
2 citations
58