Inventor

ONIKI Hideharu

JP2 patents

Patents

2 patents

US10234374B2Mar 19, 2019

Method for selecting boundary sample, apparatus for selecting boundary sample, storage medium, and system for selecting boundary sample

TOKYO ELECTRIC POWER CO HOLDINGS INC0 citations34

US10215549B2Feb 26, 2019

Method for measuring deflection amount of columnar structure and method for determining performance of columnar structure

TOKYO ELECTRIC POWER CO HOLDINGS INC0 citations26