Inventor
WINGFIELD JAMES A
US3 patents
Patents
3 patentsUS9046574B2Jun 2, 2015
Test circuit having scan warm-up
ADVANCED MICRO DEVICES INC3 citations58
US11264115B2Mar 1, 2022
Integrated circuit memory with built-in self-test (BIST)
ADVANCED MICRO DEVICES INC1 citations55
US12487284B2Dec 2, 2025
Testing multi-cycle paths using scan test
ADVANCED MICRO DEVICES INC0 citations53