Inventor

UCHIKADO AKIHITO

JP2 patents

Patents

2 patents

US12320842B2Jun 3, 2025

Inspection device for a semiconductor device

HAMAMATSU PHOTONICS KK0 citations56

US12340504B2Jun 24, 2025

Semiconductor inspecting method and semiconductor inspecting device

HAMAMATSU PHOTONICS KK0 citations51