P

Inventor

MIAN MICHAEL

US22 patents
⚠️ This page may combine multiple inventors who share the name “MIAN MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NAT SEMICONDUCTOR CORP

21 patents
US7301212B1Nov 27, 2007

MEMS microphone

NAT SEMICONDUCTOR CORP54 citations96
US6963091B1Nov 8, 2005

Spin-injection devices on silicon material for conventional BiCMOS technology

NAT SEMICONDUCTOR CORP43 citations92
US6956269B1Oct 18, 2005

Spin-polarization of carriers in semiconductor materials for spin-based microelectronic devices

NAT SEMICONDUCTOR CORP21 citations92
US7373833B2May 20, 2008

MEMS pressure sensing device

NAT SEMICONDUCTOR CORP21 citations91
US7328609B1Feb 12, 2008

Wireless pressure sensing Schrader valve

NAT SEMICONDUCTOR CORP14 citations84
US7239712B1Jul 3, 2007

Inductor-based MEMS microphone

NAT SEMICONDUCTOR CORP10 citations84
US7105906B1Sep 12, 2006

Photodiode that reduces the effects of surface recombination sites

NAT SEMICONDUCTOR CORP14 citations84
US6864581B1Mar 8, 2005

Etched metal trace with reduced RF impendance resulting from the skin effect

NAT SEMICONDUCTOR CORP14 citations84
US6853079B1Feb 8, 2005

Conductive trace with reduced RF impedance resulting from the skin effect

NAT SEMICONDUCTOR CORP12 citations84
US7057174B1Jun 6, 2006

High-speed photon detector and method of forming the detector

NAT SEMICONDUCTOR CORP8 citations74
US7022532B1Apr 4, 2006

Method of making spin-injection devices on silicon material for conventional BiCMOS technology

NAT SEMICONDUCTOR CORP5 citations74
US7022968B1Apr 4, 2006

Optical sensor that measures the light output by the combustion chamber of an internal combustion engine

NAT SEMICONDUCTOR CORP10 citations74
US6703710B1Mar 9, 2004

Dual damascene metal trace with reduced RF impedance resulting from the skin effect

NAT SEMICONDUCTOR CORP9 citations74
US7121146B1Oct 17, 2006

MEMS pressure sensing device

NAT SEMICONDUCTOR CORP8 citations72
US7309639B1Dec 18, 2007

Method of forming a metal trace with reduced RF impedance resulting from the skin effect

NAT SEMICONDUCTOR CORP2 citations63
US6740956B1May 25, 2004

Metal trace with reduced RF impedance resulting from the skin effect

NAT SEMICONDUCTOR CORP4 citations63
US8004061B1Aug 23, 2011

Conductive trace with reduced RF impedance resulting from the skin effect

NAT SEMICONDUCTOR CORP1 citations52
US7642116B1Jan 5, 2010

Method of forming a photodiode that reduces the effects of surface recombination sites

NAT SEMICONDUCTOR CORP0 citations52
US7223680B1May 29, 2007

Method of forming a dual damascene metal trace with reduced RF impedance resulting from the skin effect

NAT SEMICONDUCTOR CORP1 citations52
US7098044B1Aug 29, 2006

Method of forming an etched metal trace with reduced RF impedance resulting from the skin effect

NAT SEMICONDUCTOR CORP1 citations52
US7021151B1Apr 4, 2006

MEMS pressure sensing array with leaking sensor

NAT SEMICONDUCTOR CORP1 citations51

FOVEON INC

1 patent