Inventor
MIAN MICHAEL
US22 patents
⚠️ This page may combine multiple inventors who share the name “MIAN MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NAT SEMICONDUCTOR CORP
21 patentsUS7301212B1Nov 27, 2007
MEMS microphone
NAT SEMICONDUCTOR CORP54 citations96
US6963091B1Nov 8, 2005
Spin-injection devices on silicon material for conventional BiCMOS technology
NAT SEMICONDUCTOR CORP43 citations92
US6956269B1Oct 18, 2005
Spin-polarization of carriers in semiconductor materials for spin-based microelectronic devices
NAT SEMICONDUCTOR CORP21 citations92
US7373833B2May 20, 2008
MEMS pressure sensing device
NAT SEMICONDUCTOR CORP21 citations91
US7328609B1Feb 12, 2008
Wireless pressure sensing Schrader valve
NAT SEMICONDUCTOR CORP14 citations84
US7239712B1Jul 3, 2007
Inductor-based MEMS microphone
NAT SEMICONDUCTOR CORP10 citations84
US7105906B1Sep 12, 2006
Photodiode that reduces the effects of surface recombination sites
NAT SEMICONDUCTOR CORP14 citations84
US6864581B1Mar 8, 2005
Etched metal trace with reduced RF impendance resulting from the skin effect
NAT SEMICONDUCTOR CORP14 citations84
US6853079B1Feb 8, 2005
Conductive trace with reduced RF impedance resulting from the skin effect
NAT SEMICONDUCTOR CORP12 citations84
US7057174B1Jun 6, 2006
High-speed photon detector and method of forming the detector
NAT SEMICONDUCTOR CORP8 citations74
US7022532B1Apr 4, 2006
Method of making spin-injection devices on silicon material for conventional BiCMOS technology
NAT SEMICONDUCTOR CORP5 citations74
US7022968B1Apr 4, 2006
Optical sensor that measures the light output by the combustion chamber of an internal combustion engine
NAT SEMICONDUCTOR CORP10 citations74
US6703710B1Mar 9, 2004
Dual damascene metal trace with reduced RF impedance resulting from the skin effect
NAT SEMICONDUCTOR CORP9 citations74
US7121146B1Oct 17, 2006
MEMS pressure sensing device
NAT SEMICONDUCTOR CORP8 citations72
US7309639B1Dec 18, 2007
Method of forming a metal trace with reduced RF impedance resulting from the skin effect
NAT SEMICONDUCTOR CORP2 citations63
US6740956B1May 25, 2004
Metal trace with reduced RF impedance resulting from the skin effect
NAT SEMICONDUCTOR CORP4 citations63
US8004061B1Aug 23, 2011
Conductive trace with reduced RF impedance resulting from the skin effect
NAT SEMICONDUCTOR CORP1 citations52
US7642116B1Jan 5, 2010
Method of forming a photodiode that reduces the effects of surface recombination sites
NAT SEMICONDUCTOR CORP0 citations52
US7223680B1May 29, 2007
Method of forming a dual damascene metal trace with reduced RF impedance resulting from the skin effect
NAT SEMICONDUCTOR CORP1 citations52
US7098044B1Aug 29, 2006
Method of forming an etched metal trace with reduced RF impedance resulting from the skin effect
NAT SEMICONDUCTOR CORP1 citations52
US7021151B1Apr 4, 2006
MEMS pressure sensing array with leaking sensor
NAT SEMICONDUCTOR CORP1 citations51