Inventor
MUSSHOFF CHRISTIAN
AT3 patents
Patents
3 patentsUS7265564B2Sep 4, 2007
Method for testing a contact region of a semiconductor module
INFINEON TECHNOLOGIES AG2 citations54
US10018667B2Jul 10, 2018
Method for testing semiconductor dies
INFINEON TECHNOLOGIES AG0 citations46
US9435849B2Sep 6, 2016
Method for testing semiconductor dies and a test apparatus
INFINEON TECHNOLOGIES AG0 citations46