Inventor · disambiguated record
Jin-Fu Li
Also filed as: LI JIN · LI JIN-FU
10 granted patents·2 pending applications·31 citations·filing 2001–2023
85Inventor score
Files withFARADAY TECH CORP4IND TECH RES INST4KUNSHAN IMAGENE MEDICAL CO LTD2BEIJING BAIDU NETCOM SCI & TECH CO LTD1UNIV NAT CENTRAL1
Top patents by PatentIndex Score
12 records- 0181US9406401B23-D memory and built-in self-test circuit thereofIND TECH RES INST·Filed 2012·Granted Aug 2, 2016·10 cites·11 claims
- 0269US9588717B2Fault-tolerance through silicon via interface and controlling method thereofIND TECH RES INST·Filed 2014·Granted Mar 7, 2017·3 cites·16 claims
- 0361US12150811B2Ultrasound scanning control method, ultrasound scanning device, and storage mediumKUNSHAN IMAGENE MEDICAL CO LTD·Filed 2023·Granted Nov 26, 2024·0 cites·16 claims
- 0458US10311964B2Memory control circuit and memory test methodIND TECH RES INST·Filed 2017·Granted Jun 4, 2019·2 cites·16 claims
- 0558US10209298B2Delay measurement circuit and measuring method thereofUNIV NAT CENTRAL·Filed 2016·Granted Feb 19, 2019·1 cites·8 claims
- 0657US7596728B2Built-in self repair circuit for a multi-port memory and method thereofFARADAY TECH CORP·Filed 2007·Granted Sep 29, 2009·4 cites·20 claims
- 0747US2022198846A1Method for controlling data collection, electronic device, and mediumBEIJING BAIDU NETCOM SCI & TECH CO LTD·Filed 2022·Application pending·0 cites
- 0846US11872079B2Ultrasound scanning control method, ultrasound scanning device, and storage mediumKUNSHAN IMAGENE MEDICAL CO LTD·Filed 2019·Granted Jan 16, 2024·0 cites·18 claims
- 0945US7779312B2Built-in redundancy analyzer and method for redundancy analysisFARADAY TECH CORP·Filed 2007·Granted Aug 17, 2010·2 cites·19 claims
- 1045US6459638B1Built-in programmable self-diagnostic circuit for SRAM unitFARADAY TECH CORP·Filed 2001·Granted Oct 1, 2002·5 cites·4 claims
- 1142US6529430B2Built-in programmable self-diagnostic circuit for SRAM unitFARADAY TECH CORP·Filed 2002·Granted Mar 4, 2003·4 cites·5 claims
- 1242US2014325311A1Hybrid error correction method and memory repair apparatus thereofIND TECH RES INST·Filed 2013·Application pending·0 cites
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