Inventor
ALMOG IDO
IL14 patents
Patents
14 patentsUS9535014B1Jan 3, 2017
Systems and methods for inspecting an object
APPLIED MATERIALS ISRAEL LTD8 citations82
US11250560B2Feb 15, 2022
Methods and systems for expediting multi-perspective wafer analysis
APPLIED MATERIALS ISRAEL LTD2 citations71
US11035803B1Jun 15, 2021
Multi-perspective examination of a specimen
APPLIED MATERIALS ISRAEL LTD3 citations70
US11195267B1Dec 7, 2021
Multi-perspective wafer analysis using an acousto-optic deflector
APPLIED MATERIALS ISRAEL LTD4 citations69
US11662324B1May 30, 2023
Three-dimensional surface metrology of wafers
APPLIED MATERIALS ISRAEL LTD2 citations66
US11859963B2Jan 2, 2024
Depth profiling of semiconductor structures using picosecond ultrasonics
APPLIED MATERIALS ISRAEL LTD0 citations59
US11519720B2Dec 6, 2022
Depth profiling of semiconductor structures using picosecond ultrasonics
APPLIED MATERIALS ISRAEL LTD0 citations59
US11803961B2Oct 31, 2023
Die-to-multi-die wafer inspection
APPLIED MATERIALS ISRAEL LTD0 citations56
US11815470B2Nov 14, 2023
Multi-perspective wafer analysis
APPLIED MATERIALS ISRAEL LTD0 citations47
US10902582B2Jan 26, 2021
Computerized system and method for obtaining information about a region of an object
APPLIED MATERIALS ISRAEL LTD0 citations47
US11688055B2Jun 27, 2023
Methods and systems for analysis of wafer scan data
APPLIED MATERIALS ISRAEL LTD0 citations46
US12278085B2Apr 15, 2025
Hybrid scanning electron microscopy and acousto-optic based metrology
APPLIED MATERIALS ISRAEL LTD0 citations45
US11713964B1Aug 1, 2023
Cathodoluminescence focal scans to characterize 3D NAND CH profile
APPLIED MATERIALS ISRAEL LTD0 citations44
US9784689B2Oct 10, 2017
Method and system for inspecting an object with an array of beams
APPLIED MATERIALS ISRAEL LTD0 citations40