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Inventor
SCHIJVENAARS LODEWIJK ALEXANDER
NL
2 patents
Patents
2 patents
US7999912B2
Aug 16, 2011
Lithographic apparatus and sensor calibration method
ASML NETHERLANDS BV
7 citations
81
US12474632B2
Nov 18, 2025
Pellicle frame for EUV lithography
ASML NETHERLANDS BV
0 citations
50