Inventor

OH SE-JANG

KR11 patents

⚠️ This page may combine multiple inventors who share the name “OH SE-JANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

8 patents

US7880490B2Feb 1, 2011

Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same

SAMSUNG ELECTRONICS CO LTD8 citations83

US8026733B2Sep 27, 2011

Interface structure of wafer test equipment

SAMSUNG ELECTRONICS CO LTD10 citations82

US6625766B1Sep 23, 2003

Tester of semiconductor memory device and test method thereof

SAMSUNG ELECTRONICS CO LTD14 citations82

US6445172B1Sep 3, 2002

Wafer probing system and method of calibrating wafer probing needle using the same

SAMSUNG ELECTRONICS CO LTD9 citations71

US7884628B2Feb 8, 2011

Interposer and probe card having the same

SAMSUNG ELECTRONICS CO LTD4 citations62

US6507801B1Jan 14, 2003

Semiconductor device testing system

SAMSUNG ELECTRONICS CO LTD6 citations62

US7973550B2Jul 5, 2011

Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD3 citations58

US7538566B2May 26, 2009

Electrical test system including coaxial cables

SAMSUNG ELECTRONICS CO LTD0 citations41

LEE SANG-HOON

2 patents

US8606102B2Dec 10, 2013

Test interface device, test system and optical interface memory device

LEE SANG-HOON4 citations58

US8139949B2Mar 20, 2012

Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same

LEE SANG-HOON0 citations39

OH SE-JANG

1 patent

US8674718B2Mar 18, 2014

Built off testing apparatus

OH SE-JANG2 citations51