P

Inventor

HASHIZUME TAKESHI

JP57 patents
⚠️ This page may combine multiple inventors who share the name “HASHIZUME TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

21 patents
US6449204B1Sep 10, 2002

Dynamic semiconductor memory device capable of rearranging data storage from a one bit/one cell scheme in a normal mode to a one bit/two cell scheme in a twin-cell mode for lengthening a refresh interval

MITSUBISHI ELECTRIC CORP190 citations99
US6539511B1Mar 25, 2003

Semiconductor integrated circuit devices with test circuit

MITSUBISHI ELECTRIC CORP58 citations96
US5260949ANov 9, 1993

Scan path system and an integrated circuit device using the same

MITSUBISHI ELECTRIC CORP82 citations96
US5150044ASep 22, 1992

Semiconductor integrated circuit device comprising scan paths having individual controllable bypasses

MITSUBISHI ELECTRIC CORP95 citations96
US5109190AApr 28, 1992

Semiconductor apparatus including semiconductor integrated circuit and operating method thereof

MITSUBISHI ELECTRIC CORP59 citations96
US6259639B1Jul 10, 2001

Semiconductor integrated circuit device capable of repairing defective parts in a large-scale memory

MITSUBISHI ELECTRIC CORP53 citations93
US5911039AJun 8, 1999

Integrated circuit device comprising a plurality of functional modules each performing predetermined function

MITSUBISHI ELECTRIC CORP26 citations93
US5703513ADec 30, 1997

Master-slave bistable latch with clock input control

MITSUBISHI ELECTRIC CORP24 citations93
US5646422AJul 8, 1997

Semiconductor integrated circuit device

MITSUBISHI ELECTRIC CORP28 citations93
US5448575ASep 5, 1995

Bypass scan path and integrated circuit device using the same

MITSUBISHI ELECTRIC CORP42 citations93
US5130647AJul 14, 1992

Scan test circuit and semiconductor integrated circuit device using the same

MITSUBISHI ELECTRIC CORP32 citations93
US5621694AApr 15, 1997

Semiconductor integrated device with an improved performance

MITSUBISHI ELECTRIC CORP23 citations92
US4995039AFeb 19, 1991

Circuit for transparent scan path testing of integrated circuit devices

MITSUBISHI ELECTRIC CORP29 citations92
US5715171AFeb 3, 1998

Logical synthesizing device, logical synthesizing method, and semiconductor integrated circuit

MITSUBISHI ELECTRIC CORP24 citations91
US5315182AMay 24, 1994

Semiconductor integrated circuit having annular power supply with plural lines

MITSUBISHI ELECTRIC CORP20 citations91
US5841791ANov 24, 1998

Bypass scan path and integrated circuit device using the same

MITSUBISHI ELECTRIC CORP17 citations84
US5173870ADec 22, 1992

Transmission and latch circuit for logic signal

MITSUBISHI ELECTRIC CORP31 citations84
US5633806AMay 27, 1997

Semiconductor integrated circuit and method of designing same

MITSUBISHI ELECTRIC CORP18 citations82
US5493506AFeb 20, 1996

Integrated circuit device and method of designing same

MITSUBISHI ELECTRIC CORP14 citations72
US4894564AJan 16, 1990

Programmable logic array with reduced product term line voltage swing to speed operation

MITSUBISHI ELECTRIC CORP6 citations60
US5970096AOct 19, 1999

Synchronous serial transfer apparatus and synchronous serial transfer method

MITSUBISHI ELECTRIC CORP4 citations57

TOYOTA MOTOR CO LTD

10 patents

RENESAS TECH CORP

6 patents

MITSUBISHI FUSO TRUCK & BUS

4 patents

AISIN SEIKI

3 patents

RENESAS ELECTRONICS CORP

2 patents

DENSO CORP

1 patent

DAIICHI SEIYAKU CO

1 patent

HASHIZUME TAKESHI

1 patent

TOYAMA DAISUKE

1 patent

Showing the top 50 of 57 patents by PatentIndex Score.