Inventor
ADEL MIKE
IL13 patents
⚠️ This page may combine multiple inventors who share the name “ADEL MIKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
7 patentsUS7656528B2Feb 2, 2010
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP60 citations97
US9476698B2Oct 25, 2016
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP22 citations92
US10649447B2May 12, 2020
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
KLA TENCOR CORP2 citations72
US10151584B2Dec 11, 2018
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP0 citations51
US9835447B2Dec 5, 2017
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP0 citations51
US9234745B2Jan 12, 2016
Periodic patterns and techniques to control misalignment between two layers
KLA TENCOR CORP0 citations51
US9103662B2Aug 11, 2015
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP0 citations51
IZIKSON PAVEL
2 patentsUS8175831B2May 8, 2012
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
IZIKSON PAVEL42 citations95
US9651943B2May 16, 2017
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
IZIKSON PAVEL1 citations60