P

Inventor

NOH JIN-SEO

KR18 patents
⚠️ This page may combine multiple inventors who share the name “NOH JIN-SEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

17 patents
US7872908B2Jan 18, 2011

Phase change memory devices and fabrication methods thereof

SAMSUNG ELECTRONICS CO LTD7 citations83
US7508041B2Mar 24, 2009

Magnetic memory device having uniform switching characteristics and capable of switching with low current and associated methods

SAMSUNG ELECTRONICS CO LTD9 citations82
US7599216B2Oct 6, 2009

Phase change memory devices and fabrication methods thereof

SAMSUNG ELECTRONICS CO LTD6 citations73
US7573058B2Aug 11, 2009

Phase change materials, phase change random access memories having the same and methods of operating phase change random access memories

SAMSUNG ELECTRONICS CO LTD6 citations73
US7824953B2Nov 2, 2010

Method of operating and structure of phase change random access memory (PRAM)

SAMSUNG ELECTRONICS CO LTD2 citations63
US7642540B2Jan 5, 2010

Phase change random access memory and method of operating the same

SAMSUNG ELECTRONICS CO LTD3 citations63
US7777213B2Aug 17, 2010

Phase change layer including indium and method of manufacturing the same and phase change memory device comprising phase change layer including indium and methods of manufacturing and operating the same

SAMSUNG ELECTRONICS CO LTD4 citations62
US7674665B2Mar 9, 2010

Method of fabricating Schottky barrier transistor

SAMSUNG ELECTRONICS CO LTD5 citations62
US7626859B2Dec 1, 2009

Phase-change random access memory and programming method

SAMSUNG ELECTRONICS CO LTD5 citations62
US7541633B2Jun 2, 2009

Phase-change RAM and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD4 citations62
US7372125B2May 13, 2008

Phase change memory devices using magnetic resistance effect, methods of operating and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD4 citations62
US7956342B2Jun 7, 2011

Phase change material for use in a phase change random access memory, the phase change material having uniformly distributed insulating impurities

SAMSUNG ELECTRONICS CO LTD1 citations52
US7902011B2Mar 8, 2011

Method of fabricating Schottky barrier transistor

SAMSUNG ELECTRONICS CO LTD1 citations52
US7872250B2Jan 18, 2011

Phase-change ram and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD1 citations52
US7800186B2Sep 21, 2010

Semiconductor device and method of fabricating metal gate of the same

SAMSUNG ELECTRONICS CO LTD1 citations52
US7993963B2Aug 9, 2011

Phase change layer and method of manufacturing the same and phase change memory device comprising phase change layer and methods of manufacturing and operating phase change memory device

SAMSUNG ELECTRONICS CO LTD1 citations51
US7572662B2Aug 11, 2009

Method of fabricating phase change RAM including a fullerene layer

SAMSUNG ELECTRONICS CO LTD1 citations51

PARK SUNG-HO

1 patent