Inventor · disambiguated record

Tomokazu Yoneda

Also filed as: YONEDA TOMOKAZU

2 granted patents·4 citations·filing 2011–2012

44Inventor score

Technology areasG01R

Files withINOUE MICHIKO1 SATO YASUO1

Top patents by PatentIndex Score

2 records

0164US8959001B2Test pattern generation for semiconductor integrated circuitINOUE MICHIKO·Filed 2012·Granted Feb 17, 2015·3 cites·8 claims
0250US9316684B2Semiconductor device, detection method and programSATO YASUO·Filed 2011·Granted Apr 19, 2016·1 cites·11 claims

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