P

Inventor

KAWANAMI YOSHIMI

JP79 patents
⚠️ This page may combine multiple inventors who share the name “KAWANAMI YOSHIMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

31 patents
US6538254B1Mar 25, 2003

Method and apparatus for sample fabrication

HITACHI LTD315 citations99
US7071475B2Jul 4, 2006

Method and apparatus for specimen fabrication

HITACHI LTD61 citations97
US6828566B2Dec 7, 2004

Method and apparatus for specimen fabrication

HITACHI LTD62 citations97
US5825035AOct 20, 1998

Processing method and apparatus using focused ion beam generating means

HITACHI LTD140 citations97
US7138628B2Nov 21, 2006

Method and apparatus for specimen fabrication

HITACHI LTD35 citations96
US6583426B1Jun 24, 2003

Projection ion beam machining apparatus

HITACHI LTD56 citations96
US5583344ADec 10, 1996

Process method and apparatus using focused ion beam generating means

HITACHI LTD73 citations96
US5504340AApr 2, 1996

Process method and apparatus using focused ion beam generating means

HITACHI LTD94 citations96
US4936968AJun 26, 1990

Ion-beam machining method and apparatus

HITACHI LTD61 citations96
US7525108B2Apr 28, 2009

Focused ion beam apparatus for specimen fabrication

HITACHI LTD16 citations93
US7397050B2Jul 8, 2008

Method and apparatus for specimen fabrication

HITACHI LTD16 citations93
US7397052B2Jul 8, 2008

Method and apparatus for specimen fabrication

HITACHI LTD16 citations93
US7176458B2Feb 13, 2007

Method and apparatus for specimen fabrication

HITACHI LTD18 citations93
US5767516AJun 16, 1998

Electron microscope and sample observing method using the same

HITACHI LTD20 citations93
US4755685AJul 5, 1988

Ion micro beam apparatus

HITACHI LTD41 citations93
US4710632ADec 1, 1987

Ion microbeam apparatus

HITACHI LTD28 citations93
US6333599B1Dec 25, 2001

Plasma display system

HITACHI LTD42 citations92
US6140644AOct 31, 2000

Inspection apparatus and method using a particle beam

HITACHI LTD28 citations92
US5554257ASep 10, 1996

Method of treating surfaces with atomic or molecular beam

HITACHI LTD33 citations92
US5120925AJun 9, 1992

Methods for device transplantation

HITACHI LTD28 citations92
US5077266ADec 31, 1991

Method of forming weak-link josephson junction, and superconducting device employing the junction

HITACHI LTD25 citations92
US5065034ANov 12, 1991

Charged particle beam apparatus

HITACHI LTD39 citations90
US7397051B2Jul 8, 2008

Method and apparatus for specimen fabrication

HITACHI LTD8 citations82
US4939364AJul 3, 1990

Specimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting method

HITACHI LTD21 citations82
US7999240B2Aug 16, 2011

Method and apparatus for specimen fabrication

HITACHI LTD4 citations74
US7791050B2Sep 7, 2010

Method and apparatus for specimen fabrication

HITACHI LTD4 citations74
US6274876B1Aug 14, 2001

Inspection apparatus and method using particle beam and the particle-beam-applied apparatus

HITACHI LTD14 citations74
US5910871AJun 8, 1999

Magnetic head having track width specified by grooves formed with projection ion beam

HITACHI LTD16 citations74
US5532494AJul 2, 1996

Treatment and observation apparatus using scanning probe

HITACHI LTD15 citations74
US4733134AMar 22, 1988

Liquid metal ion source with pulse generator control

HITACHI LTD10 citations74
US7450090B2Nov 11, 2008

Plasma display panel and imaging device using the same

HITACHI LTD1 citations63

FUJITSU HITACHI PLASMA DISPLAY

11 patents

TOMIMATSU SATOSHI

2 patents

HITACHI HIGH TECH SCIENCE CORP

2 patents

HITACHI HIGH TECH CORP

2 patents

FUJITSU LTD

1 patent

KAWANAMI YOSHIMI

1 patent

Showing the top 50 of 79 patents by PatentIndex Score.