P

Inventor

NARITA MASAKI

JP32 patents
⚠️ This page may combine multiple inventors who share the name “NARITA MASAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

18 patents
US6025117AFeb 15, 2000

Method of forming a pattern using polysilane

TOSHIBA KK423 citations98
US5444207AAug 22, 1995

Plasma generating device and surface processing device and method for processing wafers in a uniform magnetic field

TOSHIBA KK132 citations98
US5660744AAug 26, 1997

Plasma generating apparatus and surface processing apparatus

TOSHIBA KK65 citations96
US6383942B1May 7, 2002

Dry etching method

TOSHIBA KK27 citations93
US6274507B1Aug 14, 2001

Plasma processing apparatus and method

TOSHIBA KK33 citations92
US6270948B1Aug 7, 2001

Method of forming pattern

TOSHIBA KK54 citations92
US7732338B2Jun 8, 2010

Method of fabricating semiconductor device with reduced pitch

TOSHIBA KK10 citations84
US6333246B1Dec 25, 2001

Semiconductor device manufacturing method using electrostatic chuck and semiconductor device manufacturing system

TOSHIBA KK18 citations82
US6376347B1Apr 23, 2002

Method of making gate wiring layer over semiconductor substrate

TOSHIBA KK17 citations77
US6911398B2Jun 28, 2005

Method of sequentially processing a plurality of lots each including semiconductor substrates

TOSHIBA KK10 citations74
US5879863AMar 9, 1999

Pattern forming method

TOSHIBA KK12 citations74
US6685797B2Feb 3, 2004

Semiconductor device manufacturing system for etching a semiconductor by plasma discharge

TOSHIBA KK10 citations72
US6887802B2May 3, 2005

Method of manufacturing semiconductor device and semiconductor device

TOSHIBA KK3 citations63
US6313535B1Nov 6, 2001

Wiring layer of a semiconductor integrated circuit

TOSHIBA KK3 citations62
US6368977B1Apr 9, 2002

Semiconductor device manufacturing method

TOSHIBA KK3 citations60
US7067761B2Jun 27, 2006

Semiconductor device manufacturing system for etching a semiconductor by plasma discharge

TOSHIBA KK0 citations51
US6989073B2Jan 24, 2006

Semiconductor device manufacturing system for etching a semiconductor by plasma discharge

TOSHIBA KK0 citations51
US7208400B2Apr 24, 2007

Method of manufacturing a semiconductor device including a dielectric film formed between first and second electrode layers

TOSHIBA KK0 citations42

RICOH KK

7 patents

SUZUKI MOTOR CO

4 patents

IBM

1 patent

SIEMENS AG

1 patent

HORITA HIROFUMI

1 patent