Inventor

WAN IFAR

US3 patents

Patents

3 patents

US9922725B2Mar 20, 2018

Integrated circuit defect detection and repair

INTEL CORP2 citations70

US9548137B2Jan 17, 2017

Integrated circuit defect detection and repair

INTEL CORP4 citations70

US9564245B2Feb 7, 2017

Integrated circuit defect detection and repair

INTEL CORP1 citations47