Inventor

NAM BYOUNG SUB

KR2 patents

Patents

2 patents

US7422830B2Sep 9, 2008

Method for detecting failure of database patterns of photo mask

HYNIX SEMICONDUCTOR INC8 citations68

US7332252B2Feb 19, 2008

Method of forming a mask layout and layout formed by the same

HYNIX SEMICONDUCTOR INC7 citations68