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Inventor

IACOPONI JOHN A

US42 patents
⚠️ This page may combine multiple inventors who share the name “IACOPONI JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

37 patents
US6228754B1May 8, 2001

Method for forming semiconductor seed layers by inert gas sputter etching

ADVANCED MICRO DEVICES INC87 citations98
US6103085AAug 15, 2000

Electroplating uniformity by diffuser design

ADVANCED MICRO DEVICES INC134 citations98
US5918149AJun 29, 1999

Deposition of a conductor in a via hole or trench

ADVANCED MICRO DEVICES INC93 citations97
US6239021B1May 29, 2001

Dual barrier and conductor deposition in a dual damascene process for semiconductors

ADVANCED MICRO DEVICES INC52 citations96
US5545592AAug 13, 1996

Nitrogen treatment for metal-silicide contact

ADVANCED MICRO DEVICES INC50 citations96
US6468889B1Oct 22, 2002

Backside contact for integrated circuit and method of forming same

ADVANCED MICRO DEVICES INC98 citations95
US6649533B1Nov 18, 2003

Method and apparatus for forming an under bump metallurgy layer

ADVANCED MICRO DEVICES INC25 citations93
US6362526B1Mar 26, 2002

Alloy barrier layers for semiconductors

ADVANCED MICRO DEVICES INC33 citations93
US6340633B1Jan 22, 2002

Method for ramped current density plating of semiconductor vias and trenches

ADVANCED MICRO DEVICES INC35 citations93
US6232230B1May 15, 2001

Semiconductor interconnect interface processing by high temperature deposition

ADVANCED MICRO DEVICES INC51 citations93
US6218078B1Apr 17, 2001

Creation of an etch hardmask by spin-on technique

ADVANCED MICRO DEVICES INC29 citations93
US6117770ASep 12, 2000

Method for implanting semiconductor conductive layers

ADVANCED MICRO DEVICES INC52 citations93
US6100181AAug 8, 2000

Low dielectric constant coating of conductive material in a damascene process for semiconductors

ADVANCED MICRO DEVICES INC31 citations93
US6048790AApr 11, 2000

Metalorganic decomposition deposition of thin conductive films on integrated circuits using reducing ambient

ADVANCED MICRO DEVICES INC48 citations93
US7557035B1Jul 7, 2009

Method of forming semiconductor devices by microwave curing of low-k dielectric films

ADVANCED MICRO DEVICES INC44 citations92
US6555479B1Apr 29, 2003

Method for forming openings for conductive interconnects

ADVANCED MICRO DEVICES INC31 citations92
US6489240B1Dec 3, 2002

Method for forming copper interconnects

ADVANCED MICRO DEVICES INC23 citations92
US6261946B1Jul 17, 2001

Method for forming semiconductor seed layers by high bias deposition

ADVANCED MICRO DEVICES INC42 citations92
US6187670B1Feb 13, 2001

Multi-stage method for forming optimized semiconductor seed layers

ADVANCED MICRO DEVICES INC45 citations92
US6159851ADec 12, 2000

Borderless vias with CVD barrier layer

ADVANCED MICRO DEVICES INC42 citations92
US6147404ANov 14, 2000

Dual barrier and conductor deposition in a dual damascene process for semiconductors

ADVANCED MICRO DEVICES INC29 citations92
US6080669AJun 27, 2000

Semiconductor interconnect interface processing by high pressure deposition

ADVANCED MICRO DEVICES INC19 citations92
US5969425AOct 19, 1999

Borderless vias with CVD barrier layer

ADVANCED MICRO DEVICES INC21 citations92
US6809032B1Oct 26, 2004

Method and apparatus for detecting the endpoint of a chemical-mechanical polishing operation using optical techniques

ADVANCED MICRO DEVICES INC18 citations84
US6413846B1Jul 2, 2002

Contact each methodology and integration scheme

ADVANCED MICRO DEVICES INC15 citations84
US6166427ADec 26, 2000

Integration of low-K SiOF as inter-layer dielectric for AL-gapfill application

ADVANCED MICRO DEVICES INC16 citations84
US6146993ANov 14, 2000

Method for forming in-situ implanted semiconductor barrier layers

ADVANCED MICRO DEVICES INC18 citations84
US6448099B1Sep 10, 2002

Method and apparatus for detecting voltage contrast in a semiconductor wafer

ADVANCED MICRO DEVICES INC14 citations75
US6489683B1Dec 3, 2002

Variable grain size in conductors for semiconductor vias and trenches

ADVANCED MICRO DEVICES INC5 citations74
US6344691B1Feb 5, 2002

Barrier materials for metal interconnect in a semiconductor device

ADVANCED MICRO DEVICES INC6 citations74
US6320263B1Nov 20, 2001

Semiconductor metalization barrier and manufacturing method therefor

ADVANCED MICRO DEVICES INC12 citations74
US6244210B1Jun 12, 2001

Strength coil for ionized copper plasma deposition

ADVANCED MICRO DEVICES INC8 citations74
US6150268ANov 21, 2000

Barrier materials for metal interconnect

ADVANCED MICRO DEVICES INC12 citations74
US5912508AJun 15, 1999

Metal-semiconductor contact formed using nitrogen plasma

ADVANCED MICRO DEVICES INC10 citations74
US6514858B1Feb 4, 2003

Test structure for providing depth of polish feedback

ADVANCED MICRO DEVICES INC8 citations73
US6346472B1Feb 12, 2002

Manufacturing method for semiconductor metalization barrier

ADVANCED MICRO DEVICES INC4 citations63
US6555396B1Apr 29, 2003

Method and apparatus for enhancing endpoint detection of a via etch

ADVANCED MICRO DEVICES INC0 citations51

GLOBALFOUNDRIES INC

2 patents

GLOBALFOUNDARIES INC

1 patent

STRECK CHRISTOF

1 patent

RYAN E TODD

1 patent