Inventor
IACOPONI JOHN A
US42 patents
⚠️ This page may combine multiple inventors who share the name “IACOPONI JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
37 patentsUS6228754B1May 8, 2001
Method for forming semiconductor seed layers by inert gas sputter etching
ADVANCED MICRO DEVICES INC87 citations98
US6103085AAug 15, 2000
Electroplating uniformity by diffuser design
ADVANCED MICRO DEVICES INC134 citations98
US5918149AJun 29, 1999
Deposition of a conductor in a via hole or trench
ADVANCED MICRO DEVICES INC93 citations97
US6239021B1May 29, 2001
Dual barrier and conductor deposition in a dual damascene process for semiconductors
ADVANCED MICRO DEVICES INC52 citations96
US5545592AAug 13, 1996
Nitrogen treatment for metal-silicide contact
ADVANCED MICRO DEVICES INC50 citations96
US6468889B1Oct 22, 2002
Backside contact for integrated circuit and method of forming same
ADVANCED MICRO DEVICES INC98 citations95
US6649533B1Nov 18, 2003
Method and apparatus for forming an under bump metallurgy layer
ADVANCED MICRO DEVICES INC25 citations93
US6362526B1Mar 26, 2002
Alloy barrier layers for semiconductors
ADVANCED MICRO DEVICES INC33 citations93
US6340633B1Jan 22, 2002
Method for ramped current density plating of semiconductor vias and trenches
ADVANCED MICRO DEVICES INC35 citations93
US6232230B1May 15, 2001
Semiconductor interconnect interface processing by high temperature deposition
ADVANCED MICRO DEVICES INC51 citations93
US6218078B1Apr 17, 2001
Creation of an etch hardmask by spin-on technique
ADVANCED MICRO DEVICES INC29 citations93
US6117770ASep 12, 2000
Method for implanting semiconductor conductive layers
ADVANCED MICRO DEVICES INC52 citations93
US6100181AAug 8, 2000
Low dielectric constant coating of conductive material in a damascene process for semiconductors
ADVANCED MICRO DEVICES INC31 citations93
US6048790AApr 11, 2000
Metalorganic decomposition deposition of thin conductive films on integrated circuits using reducing ambient
ADVANCED MICRO DEVICES INC48 citations93
US7557035B1Jul 7, 2009
Method of forming semiconductor devices by microwave curing of low-k dielectric films
ADVANCED MICRO DEVICES INC44 citations92
US6555479B1Apr 29, 2003
Method for forming openings for conductive interconnects
ADVANCED MICRO DEVICES INC31 citations92
US6489240B1Dec 3, 2002
Method for forming copper interconnects
ADVANCED MICRO DEVICES INC23 citations92
US6261946B1Jul 17, 2001
Method for forming semiconductor seed layers by high bias deposition
ADVANCED MICRO DEVICES INC42 citations92
US6187670B1Feb 13, 2001
Multi-stage method for forming optimized semiconductor seed layers
ADVANCED MICRO DEVICES INC45 citations92
US6159851ADec 12, 2000
Borderless vias with CVD barrier layer
ADVANCED MICRO DEVICES INC42 citations92
US6147404ANov 14, 2000
Dual barrier and conductor deposition in a dual damascene process for semiconductors
ADVANCED MICRO DEVICES INC29 citations92
US6080669AJun 27, 2000
Semiconductor interconnect interface processing by high pressure deposition
ADVANCED MICRO DEVICES INC19 citations92
US5969425AOct 19, 1999
Borderless vias with CVD barrier layer
ADVANCED MICRO DEVICES INC21 citations92
US6809032B1Oct 26, 2004
Method and apparatus for detecting the endpoint of a chemical-mechanical polishing operation using optical techniques
ADVANCED MICRO DEVICES INC18 citations84
US6413846B1Jul 2, 2002
Contact each methodology and integration scheme
ADVANCED MICRO DEVICES INC15 citations84
US6166427ADec 26, 2000
Integration of low-K SiOF as inter-layer dielectric for AL-gapfill application
ADVANCED MICRO DEVICES INC16 citations84
US6146993ANov 14, 2000
Method for forming in-situ implanted semiconductor barrier layers
ADVANCED MICRO DEVICES INC18 citations84
US6448099B1Sep 10, 2002
Method and apparatus for detecting voltage contrast in a semiconductor wafer
ADVANCED MICRO DEVICES INC14 citations75
US6489683B1Dec 3, 2002
Variable grain size in conductors for semiconductor vias and trenches
ADVANCED MICRO DEVICES INC5 citations74
US6344691B1Feb 5, 2002
Barrier materials for metal interconnect in a semiconductor device
ADVANCED MICRO DEVICES INC6 citations74
US6320263B1Nov 20, 2001
Semiconductor metalization barrier and manufacturing method therefor
ADVANCED MICRO DEVICES INC12 citations74
US6244210B1Jun 12, 2001
Strength coil for ionized copper plasma deposition
ADVANCED MICRO DEVICES INC8 citations74
US6150268ANov 21, 2000
Barrier materials for metal interconnect
ADVANCED MICRO DEVICES INC12 citations74
US5912508AJun 15, 1999
Metal-semiconductor contact formed using nitrogen plasma
ADVANCED MICRO DEVICES INC10 citations74
US6514858B1Feb 4, 2003
Test structure for providing depth of polish feedback
ADVANCED MICRO DEVICES INC8 citations73
US6346472B1Feb 12, 2002
Manufacturing method for semiconductor metalization barrier
ADVANCED MICRO DEVICES INC4 citations63
US6555396B1Apr 29, 2003
Method and apparatus for enhancing endpoint detection of a via etch
ADVANCED MICRO DEVICES INC0 citations51