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Inventor

TELSCHOW KENNETH L

US14 patents
⚠️ This page may combine multiple inventors who share the name “TELSCHOW KENNETH L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BECHTEL BWXT IDAHO LLC

5 patents
US6401540B1Jun 11, 2002

Method and apparatus for detecting internal structures of bulk objects using acoustic imaging

BECHTEL BWXT IDAHO LLC20 citations92
US6175411B1Jan 16, 2001

Apparatus and method for measuring and imaging traveling waves

BECHTEL BWXT IDAHO LLC30 citations92
US6486962B1Nov 26, 2002

Method and apparatus for assessing material properties of sheet-like materials

BECHTEL BWXT IDAHO LLC17 citations83
US6847584B2Jan 25, 2005

Method and apparatus for acoustic imaging of objects in water

BECHTEL BWXT IDAHO LLC4 citations62
US6836336B2Dec 28, 2004

Inspection system calibration methods

BECHTEL BWXT IDAHO LLC5 citations62

US ENERGY

3 patents
US5048969ASep 17, 1991

Piezoelectric measurement of laser power

US ENERGY21 citations82
US4995260AFeb 26, 1991

Nondestructive material characterization

US ENERGY18 citations73
US5103676AApr 14, 1992

Method of noncontacting ultrasonic process monitoring

US ENERGY14 citations66

BATTELLE ENERGY ALLIANCE LLC

3 patents
US7635942B2Dec 22, 2009

Sensor apparatus

BATTELLE ENERGY ALLIANCE LLC0 citations51
US7123364B2Oct 17, 2006

Acoustic imaging microscope

BATTELLE ENERGY ALLIANCE LLC0 citations51
US7050174B2May 23, 2006

Ultra high frequency imaging acoustic microscope

BATTELLE ENERGY ALLIANCE LLC1 citations51

LOCKHEED MARTIN IDAHO TECH CO

1 patent
US5827971AOct 27, 1998

Optical vibration detection spectral analysis assembly and method for detecting vibration in an object of interest

LOCKHEED MARTIN IDAHO TECH CO51 citations89

BECTHEL BWXT IDAHO LLC

1 patent
US6134006AOct 17, 2000

Imaging photorefractive optical vibration measurement method and device

BECTHEL BWXT IDAHO LLC42 citations87

LOCKHEED IDAHO TECHNOLOGIES CO

1 patent
US5535006AJul 9, 1996

Method and system for evaluating integrity of adherence of a conductor bond to a mating surface of a substrate

LOCKHEED IDAHO TECHNOLOGIES CO18 citations71