Inventor

TUROVETS IGOR

IL17 patents

⚠️ This page may combine multiple inventors who share the name “TUROVETS IGOR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TUROVETS IGOR

NOVA MEASURING INSTR LTD

Test structure for use in metrology measurements of patterns

Test structures and metrology technique utilizing the test structures for measuring in patterned structures

Surface planarization system and method

Optical metrology for in-situ measurements

Optical metrology for in-situ measurements

Method and system for processing patterned structures

Optical metrology for in-situ measurements

NOVA LTD

Test structure design for metrology measurements in patterned samples

Test structure design for metrology measurements in patterned samples

Monitoring system and method for verifying measurements in patterned structures

Apparatus and method for electrical test prediction

Imaging metrology

Measuring local CD uniformity using scatterometry and machine learning

NANOPTICS INC

Method and a device for electro microsurgery in a physiological liquid environment

Method and device for electro microsurgery in a physiological liquid environment

Method and apparatus for concentrating laser beams

BRILL BOAZ

Monitoring system and method for verifying measurements in patterned structures