Inventor
JANKO BOZIDAR
US27 patents
Patents
27 patentsUS5940124AAug 17, 1999
Attentional maps in objective measurement of video quality degradation
TEKTRONIX INC68 citations96
US5015946AMay 14, 1991
High density probe
TEKTRONIX INC54 citations96
US4891585AJan 2, 1990
Multiple lead probe for integrated circuits in wafer form
TEKTRONIX INC78 citations96
US4110749AAug 29, 1978
Touch display to digital encoding system
TEKTRONIX INC120 citations96
US6795580B1Sep 21, 2004
Picture quality measurement using blockiness
TEKTRONIX INC62 citations95
US5221895AJun 22, 1993
Probe with microstrip transmission lines
TEKTRONIX INC52 citations95
US6433819B1Aug 13, 2002
Detection of Gaussian noise in video signals
TEKTRONIX INC22 citations92
US6075561AJun 13, 2000
Low duty-cycle transport of video reference images
TEKTRONIX INC23 citations92
US7061920B2Jun 13, 2006
Streaming media quality analyzer system
TEKTRONIX INC31 citations91
US5818520AOct 6, 1998
Programmable instrument for automatic measurement of compressed video quality
TEKTRONIX INC75 citations91
US6437821B1Aug 20, 2002
Harmonic measurement of blockiness in video signals
TEKTRONIX INC20 citations86
US6377297B1Apr 23, 2002
Detection of repeated and frozen frames in a video signal
TEKTRONIX INC27 citations86
US6690840B1Feb 10, 2004
Image alignment with global translation and linear stretch
TEKTRONIX INC16 citations84
US6633329B2Oct 14, 2003
Frozen field detection of formerly encoded video
TEKTRONIX INC16 citations83
US5166609ANov 24, 1992
Adapter and test fixture for an integrated circuit device package
TEKTRONIX INC20 citations80
US4188563AFeb 12, 1980
Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens
TEKTRONIX INC9 citations74
US4137479AJan 30, 1979
Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens
TEKTRONIX INC8 citations74
US4075533AFeb 21, 1978
Electron beam forming structure utilizing an ion trap
TEKTRONIX INC16 citations74
US5202622AApr 13, 1993
Adapter and test fixture for an integrated circuit device package
TEKTRONIX INC18 citations71
US5321365AJun 14, 1994
Reduced noise sensitivity in inverse scattering through filtering
TEKTRONIX INC18 citations69
US4277722AJul 7, 1981
Cathode ray tube having low voltage focus and dynamic correction
TEKTRONIX INC8 citations69
US4207492AJun 10, 1980
Slow-wave high frequency deflection structure
TEKTRONIX INC17 citations69
US4623819ANov 18, 1986
Accelerating and scan expansion electron lens means for a cathode ray tube
TEKTRONIX INC9 citations66
US4963821AOct 16, 1990
Probe and method for testing a populated circuit board
TEKTRONIX INC14 citations64
US4950981AAug 21, 1990
Apparatus for testing a circuit board
TEKTRONIX INC3 citations63
US7773112B2Aug 10, 2010
Automatic measurement of video parameters
TEKTRONIX INC3 citations58
US6671409B1Dec 30, 2003
Blockiness period detection of DCT-based codecs
TEKTRONIX INC0 citations51