Inventor
ADAMS JOHN A
US49 patents
⚠️ This page may combine multiple inventors who share the name “ADAMS JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SPEEDFAM IPEC CORP
12 patentsUS6143155ANov 7, 2000
Method for simultaneous non-contact electrochemical plating and planarizing of semiconductor wafers using a bipiolar electrode assembly
SPEEDFAM IPEC CORP265 citations98
US6676482B2Jan 13, 2004
Learning method and apparatus for predictive determination of endpoint during chemical mechanical planarization using sparse sampling
SPEEDFAM IPEC CORP83 citations96
US6361646B1Mar 26, 2002
Method and apparatus for endpoint detection for chemical mechanical polishing
SPEEDFAM IPEC CORP185 citations96
US6106662AAug 22, 2000
Method and apparatus for endpoint detection for chemical mechanical polishing
SPEEDFAM IPEC CORP197 citations96
US6515493B1Feb 4, 2003
Method and apparatus for in-situ endpoint detection using electrical sensors
SPEEDFAM IPEC CORP56 citations95
US6056632AMay 2, 2000
Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head
SPEEDFAM IPEC CORP202 citations94
US6491569B2Dec 10, 2002
Method and apparatus for using optical reflection data to obtain a continuous predictive signal during CMP
SPEEDFAM IPEC CORP55 citations93
US6549279B2Apr 15, 2003
Method and apparatus for optical endpoint calibration in CMP
SPEEDFAM IPEC CORP37 citations92
US6500055B1Dec 31, 2002
Oscillating orbital polisher and method
SPEEDFAM IPEC CORP21 citations92
US6184139B1Feb 6, 2001
Oscillating orbital polisher and method
SPEEDFAM IPEC CORP33 citations92
US6395130B1May 28, 2002
Hydrophobic optical endpoint light pipes for chemical mechanical polishing
SPEEDFAM IPEC CORP51 citations91
US6387807B1May 14, 2002
Method for selective removal of copper
SPEEDFAM IPEC CORP34 citations87
FOUR PI SYSTEMS CORP
6 patentsUS4926452AMay 15, 1990
Automated laminography system for inspection of electronics
FOUR PI SYSTEMS CORP186 citations98
US5259012ANov 2, 1993
Laminography system and method with electromagnetically directed multipath radiation source
FOUR PI SYSTEMS CORP131 citations97
US5291535AMar 1, 1994
Method and apparatus for detecting excess/insufficient solder defects
FOUR PI SYSTEMS CORP73 citations95
US5097492AMar 17, 1992
Automated laminography system for inspection of electronics
FOUR PI SYSTEMS CORP95 citations95
US5081656AJan 14, 1992
Automated laminography system for inspection of electronics
FOUR PI SYSTEMS CORP111 citations95
US5199054AMar 30, 1993
Method and apparatus for high resolution inspection of electronic items
FOUR PI SYSTEMS CORP87 citations94
INTEGRATED PROCESS EQUIPMENT C
5 patentsUS6132586AOct 17, 2000
Method and apparatus for non-contact metal plating of semiconductor wafers using a bipolar electrode assembly
INTEGRATED PROCESS EQUIPMENT C168 citations98
US6121152ASep 19, 2000
Method and apparatus for planarization of metallized semiconductor wafers using a bipolar electrode assembly
INTEGRATED PROCESS EQUIPMENT C106 citations97
US5755614AMay 26, 1998
Rinse water recycling in CMP apparatus
INTEGRATED PROCESS EQUIPMENT C143 citations97
US5664990ASep 9, 1997
Slurry recycling in CMP apparatus
INTEGRATED PROCESS EQUIPMENT C233 citations97
US5855792AJan 5, 1999
Rinse water recycling method for semiconductor wafer processing equipment
INTEGRATED PROCESS EQUIPMENT C56 citations96
HEWLETT PACKARD CO
4 patentsUS5621811AApr 15, 1997
Learning method and apparatus for detecting and controlling solder defects
HEWLETT PACKARD CO152 citations98
US5687209ANov 11, 1997
Automatic warp compensation for laminographic circuit board inspection
HEWLETT PACKARD CO61 citations96
US5583904ADec 10, 1996
Continuous linear scan laminography system and method
HEWLETT PACKARD CO89 citations96
US5561696AOct 1, 1996
Method and apparatus for inspecting electrical connections
HEWLETT PACKARD CO73 citations95
JMAR TECHNOLOGIES INC
3 patentsUS7551279B2Jun 23, 2009
Systems and methods for detecting normal levels of bacteria in water using a multiple angle light scattering (MALS) instrument
JMAR TECHNOLOGIES INC11 citations78
US7518723B2Apr 14, 2009
Systems and methods for detecting radiation, biotoxin, chemical, and biological warfare agents using a multiple angle light scattering (MALS) instrument
JMAR TECHNOLOGIES INC18 citations78
US7554661B2Jun 30, 2009
Systems and methods for detection and classification of waterborne particles using a multiple angle light scattering (MALS) instrument
JMAR TECHNOLOGIES INC6 citations60
ADAMS JOHN A
3 patentsUS8243272B2Aug 14, 2012
Systems and methods for detecting normal levels of bacteria in water using a multiple angle light scattering (MALS) instrument
ADAMS JOHN A4 citations61
US8085399B2Dec 27, 2011
Systems and methods for a multiple angle light scattering (MALS) instrument having two-dimensional detector array
ADAMS JOHN A3 citations60
US8134704B2Mar 13, 2012
Systems and methods for detecting normal levels of bacteria in water using a multiple angle light scattering (MALS) instrument
ADAMS JOHN A4 citations54