Inventor

JANG SUNGHOON

KR3 patents

Patents

3 patents

US8762901B2Jun 24, 2014

Method for process proximity correction

SAMSUNG ELECTRONICS CO LTD5 citations64

US9915681B2Mar 13, 2018

Semiconductor test apparatus having pogo pins coated with conduction films

SAMSUNG ELECTRONICS CO LTD0 citations47

US12541635B2Feb 3, 2026

Method for optical proximity correction of photomask layout utilizing parameters obtained through actual photomask manufacture

SAMSUNG ELECTRONICS CO LTD0 citations37