Inventor
VANKAYALAPATI BHANU TEJA
US3 patents
Patents
3 patentsUS11397209B2Jul 26, 2022
Methods of monitoring conditions associated with aging of silicon carbide power MOSFET devices in-situ, related circuits and computer program products
UNIV TEXAS6 citations70
US11585844B1Feb 21, 2023
Systems, circuits, and methods to detect gate-open failures in MOS based insulated gate transistors
UNIV TEXAS1 citations56
US12584799B2Mar 24, 2026
Switching transient based junction temperature estimation of SiC MOSFETs with aging compensation
UNIV TEXAS0 citations50