Inventor
AHN JINWOO
KR6 patents
⚠️ This page may combine multiple inventors who share the name “AHN JINWOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
4 patentsUS12578178B2Mar 17, 2026
Pupil image measuring device and method
SAMSUNG ELECTRONICS CO LTD0 citations61
US11921270B2Mar 5, 2024
Inspection system including reference specimen and method of forming semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations52
US12560529B2Feb 24, 2026
Imaging ellipsometer and method of measuring an overlay error using the same
SAMSUNG ELECTRONICS CO LTD0 citations43
US12111270B2Oct 8, 2024
Method of inspecting a wafer and apparatus for performing the same
SAMSUNG ELECTRONICS CO LTD0 citations43