P

Inventor

MIN YO SEP

KR32 patents
⚠️ This page may combine multiple inventors who share the name “MIN YO SEP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

28 patents
US7005391B2Feb 28, 2006

Method of manufacturing inorganic nanotube

SAMSUNG ELECTRONICS CO LTD521 citations99
US7892917B2Feb 22, 2011

Method for forming bismuth titanium silicon oxide thin film

SAMSUNG ELECTRONICS CO LTD18 citations92
US7135207B2Nov 14, 2006

Chemical vapor deposition method using alcohol for forming metal oxide thin film

SAMSUNG ELECTRONICS CO LTD36 citations92
US7132714B2Nov 7, 2006

Vertical carbon nanotube-field effect transistor and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD19 citations92
US6752869B2Jun 22, 2004

Atomic layer deposition using organometallic complex with β-diketone ligand

SAMSUNG ELECTRONICS CO LTD27 citations92
US6669990B2Dec 30, 2003

Atomic layer deposition method using a novel group IV metal precursor

SAMSUNG ELECTRONICS CO LTD20 citations92
US7767502B2Aug 3, 2010

Method for manufacturing electronic device using thin film transistor with protective cap over flexible substrate

SAMSUNG ELECTRONICS CO LTD8 citations84
US7402492B2Jul 22, 2008

Method of manufacturing a memory device having improved erasing characteristics

SAMSUNG ELECTRONICS CO LTD17 citations84
US7030450B2Apr 18, 2006

Precursor for hafnium oxide layer and method for forming halnium oxide film using the precursor

SAMSUNG ELECTRONICS CO LTD12 citations84
US6911402B2Jun 28, 2005

Deposition method of a dielectric layer

SAMSUNG ELECTRONICS CO LTD19 citations84
US7020064B2Mar 28, 2006

Rewritable data storage using carbonaceous material and writing/reading method thereof

SAMSUNG ELECTRONICS CO LTD17 citations83
US7176488B2Feb 13, 2007

Thin film transistor with protective cap over flexible substrate, electronic device using the same, and manufacturing method thereof

SAMSUNG ELECTRONICS CO LTD9 citations74
US7705347B2Apr 27, 2010

N-type carbon nanotube field effect transistor and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD5 citations73
US7381983B2Jun 3, 2008

N-type carbon nanotube field effect transistor and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD8 citations73
US6919597B2Jul 19, 2005

Bismuth titanium silicon oxide, bismuth titanium silicon oxide thin film, and method for forming the thin film

SAMSUNG ELECTRONICS CO LTD7 citations73
US6689427B2Feb 10, 2004

Group IV metal precursors and a method of chemical vapor deposition using the same

SAMSUNG ELECTRONICS CO LTD8 citations68
US7501680B2Mar 10, 2009

Memory device having nanocrystals in memory cell

SAMSUNG ELECTRONICS CO LTD2 citations63
US7379322B2May 27, 2008

Amorphous high-k thin film and manufacturing method thereof

SAMSUNG ELECTRONICS CO LTD3 citations63
US7105401B2Sep 12, 2006

Capacitor for semiconductor device, manufacturing method thereof, and electronic device employing the same

SAMSUNG ELECTRONICS CO LTD4 citations63
US7799307B2Sep 21, 2010

Method of growing single-walled carbon nanotubes

SAMSUNG ELECTRONICS CO LTD3 citations62
US7767140B2Aug 3, 2010

Method for manufacturing zinc oxide nanowires and device having the same

SAMSUNG ELECTRONICS CO LTD5 citations62
US7374994B2May 20, 2008

Bismuth titanium silicon oxide, bismuth titanium silicon oxide thin film, and method for forming the thin film

SAMSUNG ELECTRONICS CO LTD2 citations62
US7795159B2Sep 14, 2010

Charge trap layer for a charge trap semiconductor memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD1 citations52
US7713509B2May 11, 2010

Method of forming nitrogen-doped single-walled carbon nanotubes

SAMSUNG ELECTRONICS CO LTD1 citations52
US7709377B2May 4, 2010

Thin film including multi components and method of forming the same

SAMSUNG ELECTRONICS CO LTD1 citations52
US7604790B2Oct 20, 2009

Method of removing carbonaceous impurities in carbon nanotubes

SAMSUNG ELECTRONICS CO LTD1 citations52
US7501191B2Mar 10, 2009

Amorphous dielectric thin film and manufacturing method thereof

SAMSUNG ELECTRONICS CO LTD0 citations52
US7399716B2Jul 15, 2008

Precursor for hafnium oxide layer and method for forming hafnium oxide film using the precursor

SAMSUNG ELECTRONICS CO LTD1 citations52

MIN YO-SEP

2 patents

UNIV KONKUK IND COOP CORP

1 patent

LEE JUNG-HYUN

1 patent