Inventor
MIN YO SEP
KR32 patents
⚠️ This page may combine multiple inventors who share the name “MIN YO SEP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
28 patentsUS7005391B2Feb 28, 2006
Method of manufacturing inorganic nanotube
SAMSUNG ELECTRONICS CO LTD521 citations99
US7892917B2Feb 22, 2011
Method for forming bismuth titanium silicon oxide thin film
SAMSUNG ELECTRONICS CO LTD18 citations92
US7135207B2Nov 14, 2006
Chemical vapor deposition method using alcohol for forming metal oxide thin film
SAMSUNG ELECTRONICS CO LTD36 citations92
US7132714B2Nov 7, 2006
Vertical carbon nanotube-field effect transistor and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD19 citations92
US6752869B2Jun 22, 2004
Atomic layer deposition using organometallic complex with β-diketone ligand
SAMSUNG ELECTRONICS CO LTD27 citations92
US6669990B2Dec 30, 2003
Atomic layer deposition method using a novel group IV metal precursor
SAMSUNG ELECTRONICS CO LTD20 citations92
US7767502B2Aug 3, 2010
Method for manufacturing electronic device using thin film transistor with protective cap over flexible substrate
SAMSUNG ELECTRONICS CO LTD8 citations84
US7402492B2Jul 22, 2008
Method of manufacturing a memory device having improved erasing characteristics
SAMSUNG ELECTRONICS CO LTD17 citations84
US7030450B2Apr 18, 2006
Precursor for hafnium oxide layer and method for forming halnium oxide film using the precursor
SAMSUNG ELECTRONICS CO LTD12 citations84
US6911402B2Jun 28, 2005
Deposition method of a dielectric layer
SAMSUNG ELECTRONICS CO LTD19 citations84
US7020064B2Mar 28, 2006
Rewritable data storage using carbonaceous material and writing/reading method thereof
SAMSUNG ELECTRONICS CO LTD17 citations83
US7176488B2Feb 13, 2007
Thin film transistor with protective cap over flexible substrate, electronic device using the same, and manufacturing method thereof
SAMSUNG ELECTRONICS CO LTD9 citations74
US7705347B2Apr 27, 2010
N-type carbon nanotube field effect transistor and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD5 citations73
US7381983B2Jun 3, 2008
N-type carbon nanotube field effect transistor and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD8 citations73
US6919597B2Jul 19, 2005
Bismuth titanium silicon oxide, bismuth titanium silicon oxide thin film, and method for forming the thin film
SAMSUNG ELECTRONICS CO LTD7 citations73
US6689427B2Feb 10, 2004
Group IV metal precursors and a method of chemical vapor deposition using the same
SAMSUNG ELECTRONICS CO LTD8 citations68
US7501680B2Mar 10, 2009
Memory device having nanocrystals in memory cell
SAMSUNG ELECTRONICS CO LTD2 citations63
US7379322B2May 27, 2008
Amorphous high-k thin film and manufacturing method thereof
SAMSUNG ELECTRONICS CO LTD3 citations63
US7105401B2Sep 12, 2006
Capacitor for semiconductor device, manufacturing method thereof, and electronic device employing the same
SAMSUNG ELECTRONICS CO LTD4 citations63
US7799307B2Sep 21, 2010
Method of growing single-walled carbon nanotubes
SAMSUNG ELECTRONICS CO LTD3 citations62
US7767140B2Aug 3, 2010
Method for manufacturing zinc oxide nanowires and device having the same
SAMSUNG ELECTRONICS CO LTD5 citations62
US7374994B2May 20, 2008
Bismuth titanium silicon oxide, bismuth titanium silicon oxide thin film, and method for forming the thin film
SAMSUNG ELECTRONICS CO LTD2 citations62
US7795159B2Sep 14, 2010
Charge trap layer for a charge trap semiconductor memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US7713509B2May 11, 2010
Method of forming nitrogen-doped single-walled carbon nanotubes
SAMSUNG ELECTRONICS CO LTD1 citations52
US7709377B2May 4, 2010
Thin film including multi components and method of forming the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US7604790B2Oct 20, 2009
Method of removing carbonaceous impurities in carbon nanotubes
SAMSUNG ELECTRONICS CO LTD1 citations52
US7501191B2Mar 10, 2009
Amorphous dielectric thin film and manufacturing method thereof
SAMSUNG ELECTRONICS CO LTD0 citations52
US7399716B2Jul 15, 2008
Precursor for hafnium oxide layer and method for forming hafnium oxide film using the precursor
SAMSUNG ELECTRONICS CO LTD1 citations52
MIN YO-SEP
2 patentsUS8294348B2Oct 23, 2012
Field emission electrode, method of manufacturing the same, and field emission device comprising the same
MIN YO-SEP0 citations47
US8272914B2Sep 25, 2012
Method of manufacturing field emission electrode having carbon nanotubes with conductive particles attached to external walls
MIN YO-SEP0 citations47