Inventor
LIU FU-SUNG
TW2 patents
Patents
2 patentsUS6909300B2Jun 21, 2005
Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips
TAIWAN SEMICONDUCTOR MFG59 citations91
US6727719B2Apr 27, 2004
Piercer combined prober for CU interconnect water-level preliminary electrical test
TAIWAN SEMICONDUCTOR MFG42 citations87