P

Inventor

IINO SHINJI

JP46 patents
⚠️ This page may combine multiple inventors who share the name “IINO SHINJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO ELECTRON LTD

22 patents
US6344752B1Feb 5, 2002

Contactor and production method for contractor

TOKYO ELECTRON LTD83 citations98
US6140828AOct 31, 2000

Prober and probe method

TOKYO ELECTRON LTD58 citations96
US5742173AApr 21, 1998

Method and apparatus for probe testing substrate

TOKYO ELECTRON LTD101 citations96
US5568054AOct 22, 1996

Probe apparatus having burn-in test function

TOKYO ELECTRON LTD120 citations96
US5691764ANov 25, 1997

Apparatus for examining target objects such as LCD panels

TOKYO ELECTRON LTD63 citations95
US6777967B2Aug 17, 2004

Inspection method and inspection apparatus

TOKYO ELECTRON LTD17 citations92
US6747465B2Jun 8, 2004

Contractor, method for manufacturing the same, and probe card using the same

TOKYO ELECTRON LTD27 citations92
US6634245B1Oct 21, 2003

Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism

TOKYO ELECTRON LTD19 citations92
US6590381B1Jul 8, 2003

Contactor holding mechanism and automatic change mechanism for contactor

TOKYO ELECTRON LTD27 citations92
US6545493B1Apr 8, 2003

High-speed probing apparatus

TOKYO ELECTRON LTD22 citations92
US6130543AOct 10, 2000

Inspection method and apparatus for semiconductor integrated circuit, and vacuum contactor mechanism

TOKYO ELECTRON LTD34 citations92
US6075373AJun 13, 2000

Inspection device for inspecting a semiconductor wafer

TOKYO ELECTRON LTD53 citations92
US5825500AOct 20, 1998

Unit for transferring to-be-inspected object to inspection position

TOKYO ELECTRON LTD18 citations83
US6380753B1Apr 30, 2002

Screening method of semiconductor device and apparatus thereof

TOKYO ELECTRON LTD16 citations82
US7061259B2Jun 13, 2006

Inspection method and inspection apparatus

TOKYO ELECTRON LTD4 citations74
US6850052B2Feb 1, 2005

Probing method

TOKYO ELECTRON LTD10 citations74
US6747467B2Jun 8, 2004

Assembly apparatus and method of contactor

TOKYO ELECTRON LTD10 citations74
US5844199ADec 1, 1998

Conductor pattern check apparatus for locating and repairing short and open circuits

TOKYO ELECTRON LTD8 citations73
US5639390AJun 17, 1997

Conductor pattern check apparatus for locating and repairing open circuits

TOKYO ELECTRON LTD10 citations73
USRE41515EAug 17, 2010

Contactor and production method for contactor

TOKYO ELECTRON LTD2 citations63
US7319339B2Jan 15, 2008

Inspection apparatus to break the oxide of an electrode by fritting phenomenon

TOKYO ELECTRON LTD0 citations52
US7304489B2Dec 4, 2007

Inspection method and inspection apparatus

TOKYO ELECTRON LTD0 citations52

HARADA IND CO LTD

5 patents

ADEKA CORP

5 patents

NHK SPRING CO LTD

4 patents

MITSUI TOATSU CHEMICALS

3 patents

SHIGEMATSU RYOHEI

3 patents

TEL YAMANISHI KK

1 patent

TATSUMI YUKIO

1 patent

NAKAMURA TAKESHI

1 patent

TATSUMI YOKIO

1 patent