Inventor
TAKEKOSHI KIYOSHI
JP26 patents
⚠️ This page may combine multiple inventors who share the name “TAKEKOSHI KIYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
21 patentsUS6672876B1Jan 6, 2004
Probe card with pyramid shaped thin film contacts
TOKYO ELECTRON LTD74 citations98
US6501289B1Dec 31, 2002
Inspection stage including a plurality of Z shafts, and inspection apparatus
TOKYO ELECTRON LTD119 citations98
US6359455B1Mar 19, 2002
Probing card
TOKYO ELECTRON LTD64 citations96
US4896869AJan 30, 1990
Moving table apparatus
TOKYO ELECTRON LTD109 citations96
US5691764ANov 25, 1997
Apparatus for examining target objects such as LCD panels
TOKYO ELECTRON LTD63 citations95
US6777967B2Aug 17, 2004
Inspection method and inspection apparatus
TOKYO ELECTRON LTD17 citations92
US6590381B1Jul 8, 2003
Contactor holding mechanism and automatic change mechanism for contactor
TOKYO ELECTRON LTD27 citations92
US5801545ASep 1, 1998
LCD testing apparatus
TOKYO ELECTRON LTD63 citations92
US6583614B2Jun 24, 2003
Inspection stage and inspection apparatus having a plurality of Z axes
TOKYO ELECTRON LTD15 citations84
US6024629AFeb 15, 2000
Probe apparatus and a method for polishing a probe
TOKYO ELECTRON LTD16 citations84
US7256592B2Aug 14, 2007
Probe with trapezoidal contractor and device based on application thereof, and method of producing them
TOKYO ELECTRON LTD10 citations83
US7602203B2Oct 13, 2009
Probe and probe card
TOKYO ELECTRON LTD7 citations74
US7061259B2Jun 13, 2006
Inspection method and inspection apparatus
TOKYO ELECTRON LTD4 citations74
US6707310B2Mar 16, 2004
Needle load measuring method, needle load setting method and needle load detecting mechanism
TOKYO ELECTRON LTD10 citations74
US7716824B2May 18, 2010
Method of manufacturing a probe card
TOKYO ELECTRON LTD2 citations63
US6774621B2Aug 10, 2004
Inspection stage having a plurality of Z axes
TOKYO ELECTRON LTD4 citations63
US7621045B2Nov 24, 2009
Method of producing a probe with a trapezoidal contactor
TOKYO ELECTRON LTD5 citations62
US4941800AJul 17, 1990
Transfer apparatus for plate-like member
TOKYO ELECTRON LTD4 citations62
US7221176B2May 22, 2007
Vacuum prober and vacuum probe method
TOKYO ELECTRON LTD4 citations61
US7319339B2Jan 15, 2008
Inspection apparatus to break the oxide of an electrode by fritting phenomenon
TOKYO ELECTRON LTD0 citations52
US7304489B2Dec 4, 2007
Inspection method and inspection apparatus
TOKYO ELECTRON LTD0 citations52
TAKEKOSHI KIYOSHI
3 patentsUS8101436B2Jan 24, 2012
Dicing method, method of inspecting integrated circuit element, substrate holding device, and pressure sensitive adhesive film
TAKEKOSHI KIYOSHI13 citations82
US8120372B2Feb 21, 2012
Probe card for inspecting light receiving device
TAKEKOSHI KIYOSHI2 citations61
US8456186B2Jun 4, 2013
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
TAKEKOSHI KIYOSHI2 citations60
IBIDEN CO LTD
2 patentsUS7091733B2Aug 15, 2006
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
IBIDEN CO LTD30 citations91
US7242206B2Jul 10, 2007
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
IBIDEN CO LTD7 citations72