Inventor
SUGA TADATOMO
JP42 patents
⚠️ This page may combine multiple inventors who share the name “SUGA TADATOMO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SUGA TADATOMO
9 patentsUS9142532B2Sep 22, 2015
Chip-on-wafer bonding method and bonding device, and structure comprising chip and wafer
SUGA TADATOMO25 citations92
US9870922B2Jan 16, 2018
Substrate bonding apparatus and substrate bonding method
SUGA TADATOMO6 citations84
US8091764B2Jan 10, 2012
Joining method and device produced by this method and joining unit
SUGA TADATOMO13 citations81
US10166749B2Jan 1, 2019
Bonding-substrate fabrication method, bonding substrate, substrate bonding method, bonding-substrate fabrication apparatus, and substrate assembly
SUGA TADATOMO2 citations71
US9601350B2Mar 21, 2017
Bonding-substrate fabrication method, bonding substrate, substrate bonding method, bonding-substrate fabrication apparatus, and substrate assembly
SUGA TADATOMO6 citations71
US10204785B2Feb 12, 2019
Substrate bonding apparatus and substrate bonding method
SUGA TADATOMO1 citations62
US7591293B2Sep 22, 2009
Device for bonding a metal on a surface of a substrate
SUGA TADATOMO2 citations62
US9962908B2May 8, 2018
Method for bonding polymer film and polymer film, method for bonding polymer film and inorganic material substrate, polymer film laminate, and laminate of polymer film and inorganic material substrate
SUGA TADATOMO0 citations50
US8651363B2Feb 18, 2014
Joining method and device produced by this method and joining unit
SUGA TADATOMO0 citations49
TOKYO ELECTRON LTD
6 patentsUS7262613B2Aug 28, 2007
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
TOKYO ELECTRON LTD16 citations92
US6777967B2Aug 17, 2004
Inspection method and inspection apparatus
TOKYO ELECTRON LTD17 citations92
US7061259B2Jun 13, 2006
Inspection method and inspection apparatus
TOKYO ELECTRON LTD4 citations74
US7688088B2Mar 30, 2010
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
TOKYO ELECTRON LTD1 citations52
US7319339B2Jan 15, 2008
Inspection apparatus to break the oxide of an electrode by fritting phenomenon
TOKYO ELECTRON LTD0 citations52
US7304489B2Dec 4, 2007
Inspection method and inspection apparatus
TOKYO ELECTRON LTD0 citations52
BONDTECH CO LTD
4 patentsUS12409644B2Sep 9, 2025
Substrate bonding method and substrate bonding system
BONDTECH CO LTD0 citations62
US12388045B2Aug 12, 2025
Bonding system and bonding method
BONDTECH CO LTD0 citations62
US12261147B2Mar 25, 2025
Bonding system and bonding method
BONDTECH CO LTD0 citations62
US11837444B2Dec 5, 2023
Substrate joining method, substrate joining system and method for controlling hydrophilic treatment device
BONDTECH CO LTD0 citations62
RENESAS TECH CORP
3 patentsUS7268430B2Sep 11, 2007
Semiconductor device and process for manufacturing the same
RENESAS TECH CORP17 citations92
US6975489B2Dec 13, 2005
Circuit structure and semiconductor integrated circuit
RENESAS TECH CORP7 citations74
US7776735B2Aug 17, 2010
Semiconductor device and process for manufacturing the same
RENESAS TECH CORP3 citations62