Inventor

MARUYAMA SHIGEYUKI

JP69 patents

⚠️ This page may combine multiple inventors who share the name “MARUYAMA SHIGEYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MARUYAMA SHIGEYUKI

FUJITSU LTD

Wafer-level package, a method of manufacturing thereof and a method of manufacturing semiconductor devices from such a wafer-level package

Contactor for testing miniaturized devices and components

Method and mold for manufacturing semiconductor device, semiconductor device and method for mounting the device

Wafer-level package having test terminal

Semiconductor testing device

Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor

IC socket, a test method using the same and an IC socket mounting mechanism

Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier

Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit

Wafer-level package having test terminal

Semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece

Contactor for testing semiconductor device and manufacturing method thereof

Wafer-level package with test terminals

Probe card with rigid base having apertures for testing semiconductor device, and semiconductor device test method using probe card

Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit

Anisotropic conductive sheet, production process, contact structure, electronic device and inspection apparatus for operation test

Contactor having conductive particles in a hole as a contact electrode

Testing device and testing method of a semiconductor device

Semiconductor device having an alignment mark formed by the same material with a metal post

Contactor, method for manufacturing such contactor, and testing method using such contactor

Semiconductor module including a plurality of semiconductor devices detachably

Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor

Probe card and method of testing wafer having a plurality of semiconductor devices

Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor

Contactor having conductive particles in a hole as a contact electrode

IC socket, a test method using the same and an IC socket mounting mechanism

Semiconductor module including a plurality of semiconductor devices detachably

Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage

Test board and a test method using the same providing improved electrical connection

Integrated circuit bare chip carrier

Contactor for electronic parts and a contact method

Device for testing semiconductor devices at a high temperature

Electronic component attaching tool

Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor

Handling apparatus and test set using the handling apparatus

Method of attaching electronic component and electronic component attaching tool

Semiconductor testing device

Device testing contactor, method of producing the same, and device testing carrier

Semiconductor device protection cover, and semiconductor device unit including the cover

Electrical connecting method

Contactor having conductive particles in a hole as a contact electrode

Contactor having conductive particles in a hole as a contact electrode

Probe card and method of testing wafer having a plurality of semiconductor devices

Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor

Integrated circuit testing device

Contactor for electronic components and test method using the same

Contactor having contact electrodes formed by laser processing

FUJITSU MICROELECTRONICS LTD

Wafer-level package having test terminal

TASHIRO KAZUHIRO

Method of semiconductor device protection

FUJITSU SEMICONDUCTOR LTD

IC socket with attached electronic component