Inventor
TASHIRO KAZUHIRO
JP41 patents
⚠️ This page may combine multiple inventors who share the name “TASHIRO KAZUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
19 patentsUS6927343B2Aug 9, 2005
Contactor for testing miniaturized devices and components
FUJITSU LTD72 citations98
US6661247B2Dec 9, 2003
Semiconductor testing device
FUJITSU LTD41 citations96
US7129726B2Oct 31, 2006
Testing device and testing method of a semiconductor device
FUJITSU LTD26 citations92
US7112889B1Sep 26, 2006
Semiconductor device having an alignment mark formed by the same material with a metal post
FUJITSU LTD36 citations92
US6767219B2Jul 27, 2004
Contactor, method for manufacturing such contactor, and testing method using such contactor
FUJITSU LTD30 citations92
US6249135B1Jun 19, 2001
Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage
FUJITSU LTD34 citations92
US7430798B2Oct 7, 2008
Electronic component attaching tool
FUJITSU LTD10 citations84
US6924174B2Aug 2, 2005
Method of attaching electronic component and electronic component attaching tool
FUJITSU LTD7 citations74
US6882169B2Apr 19, 2005
Semiconductor testing device
FUJITSU LTD6 citations74
US6203332B1Mar 20, 2001
Attachment structure of semiconductor device socket
FUJITSU LTD10 citations74
US7382046B2Jun 3, 2008
Semiconductor device protection cover, and semiconductor device unit including the cover
FUJITSU LTD7 citations73
US7309996B2Dec 18, 2007
Contactor for electronic components and test method using the same
FUJITSU LTD9 citations72
US7403024B2Jul 22, 2008
Contactor having contact electrodes of metal springs embedded in a plate-like structure
FUJITSU LTD4 citations63
US7161370B2Jan 9, 2007
Semiconductor testing device
FUJITSU LTD2 citations63
US7145250B2Dec 5, 2006
LSI package, LSI element testing method, and semiconductor device manufacturing method
FUJITSU LTD6 citations63
US7355421B2Apr 8, 2008
Semiconductor apparatus testing arrangement and semiconductor apparatus testing method
FUJITSU LTD2 citations57
US5763297AJun 9, 1998
Integrated circuit carrier having lead-socket array with various inner dimensions
FUJITSU LTD1 citations52
US5668407ASep 16, 1997
Integrated circuit carrier having lead-socket array with various inner dimensions
FUJITSU LTD1 citations52
US7199600B2Apr 3, 2007
Semiconductor device testing method and testing equipment
FUJITSU LTD0 citations48
FUJITSU SEMICONDUCTOR LTD
5 patentsUS7915720B2Mar 29, 2011
Semiconductor integrated circuit device and test method thereof
FUJITSU SEMICONDUCTOR LTD11 citations80
US8051554B2Nov 8, 2011
IC socket with attached electronic component
FUJITSU SEMICONDUCTOR LTD3 citations63
US8759119B2Jun 24, 2014
Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state
FUJITSU SEMICONDUCTOR LTD2 citations62
US7807481B2Oct 5, 2010
Method of semiconductor device protection, package of semiconductor device
FUJITSU SEMICONDUCTOR LTD2 citations62
US7825676B2Nov 2, 2010
Contactor and test method using contactor
FUJITSU SEMICONDUCTOR LTD5 citations61
KAO CORP
4 patentsUS5374421ADec 20, 1994
Composition for hair treatment
KAO CORP63 citations96
US5041283AAug 20, 1991
Cosmetic composition
KAO CORP27 citations92
US5714136AFeb 3, 1998
Hair cosmetic containing a cationic surfactant, fat and oil and an alkyl saccharide surfactant
KAO CORP37 citations91
US7283869B2Oct 16, 2007
Apparatus for measuring body fat
KAO CORP16 citations80