Inventor
KOIZUMI DAISUKE
JP27 patents
⚠️ This page may combine multiple inventors who share the name “KOIZUMI DAISUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NTT DOCOMO INC
10 patentsUS7378924B2May 27, 2008
Filter with improved capacitive coupling portion
NTT DOCOMO INC13 citations84
US7292124B2Nov 6, 2007
Variable resonator and variable phase shifter
NTT DOCOMO INC9 citations74
US7397331B2Jul 8, 2008
Coupling structure, resonator excitation structure and filter for coplanar-waveguide circuit
NTT DOCOMO INC7 citations73
US7978027B2Jul 12, 2011
Coplanar waveguide resonator and coplanar waveguide filter using the same
NTT DOCOMO INC2 citations62
US7764147B2Jul 27, 2010
Coplanar resonator and filter using the same
NTT DOCOMO INC3 citations62
US7710222B2May 4, 2010
Dual band resonator and dual band filter
NTT DOCOMO INC2 citations62
US7307045B2Dec 11, 2007
Signal switching device
NTT DOCOMO INC3 citations62
US7564699B2Jul 21, 2009
Planar circuit housing
NTT DOCOMO INC2 citations61
US7161449B2Jan 9, 2007
Coplanar waveguide resonator
NTT DOCOMO INC1 citations52
US7774034B2Aug 10, 2010
Signal switching device
NTT DOCOMO INC0 citations51
FUJITSU LTD
9 patentsUS6927343B2Aug 9, 2005
Contactor for testing miniaturized devices and components
FUJITSU LTD72 citations98
US6563330B1May 13, 2003
Probe card and method of testing wafer having a plurality of semiconductor devices
FUJITSU LTD37 citations92
US7430798B2Oct 7, 2008
Electronic component attaching tool
FUJITSU LTD10 citations84
US6924174B2Aug 2, 2005
Method of attaching electronic component and electronic component attaching tool
FUJITSU LTD7 citations74
US6203332B1Mar 20, 2001
Attachment structure of semiconductor device socket
FUJITSU LTD10 citations74
US6774650B2Aug 10, 2004
Probe card and method of testing wafer having a plurality of semiconductor devices
FUJITSU LTD7 citations73
US7309996B2Dec 18, 2007
Contactor for electronic components and test method using the same
FUJITSU LTD9 citations72
US7403024B2Jul 22, 2008
Contactor having contact electrodes of metal springs embedded in a plate-like structure
FUJITSU LTD4 citations63
US6410354B1Jun 25, 2002
Semiconductor substrate test device and method
FUJITSU LTD2 citations60
FUJITSU SEMICONDUCTOR LTD
3 patentsUS8051554B2Nov 8, 2011
IC socket with attached electronic component
FUJITSU SEMICONDUCTOR LTD3 citations63
US7825676B2Nov 2, 2010
Contactor and test method using contactor
FUJITSU SEMICONDUCTOR LTD5 citations61
US7977961B2Jul 12, 2011
Component for testing device for electronic component and testing method of the electronic component
FUJITSU SEMICONDUCTOR LTD4 citations60