Inventor · disambiguated record
Se Whan Na
Also filed as: NA SE WHAN
7 granted patents·2 pending applications·3 citations·filing 2017–2024
72Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9
Top patents by PatentIndex Score
9 records- 0187US11862111B1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jan 2, 2024·2 cites·20 claims
- 0272US12277889B2Display driver IC including dithering circuit capable of adaptively changing threshold grayscale value depending on display brightness value, device including the same, and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Apr 15, 2025·0 cites·20 claims
- 0370US10510281B2Image processing apparatus and method, and electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Dec 17, 2019·1 cites·18 claims
- 0469US11942061B2Electronic devices and operating methods of electronic devicesSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Mar 26, 2024·0 cites·20 claims
- 0567US11810495B2Display driver IC including dithering circuit capable of adaptively changing threshold grayscale value depending on display brightness value, device including the same, and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Nov 7, 2023·0 cites·20 claims
- 0661US11574612B2Electronic devices and operating methods of electronic devicesSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 7, 2023·0 cites·20 claims
- 0755US2023153591A1Semiconductor device, method of operating semiconductor device, and semiconductor systemSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 0850US2025363930A1Display device and multiplexing driving method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0943US12217721B2Mura inspection device for compressing mura data through dimensionality reduction, operating method, and display system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 4, 2025·0 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →