Inventor

MCCAULEY SHARON

US6 patents

⚠️ This page may combine multiple inventors who share the name “MCCAULEY SHARON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR TECH CORP

2 patents

US7570800B2Aug 4, 2009

Methods and systems for binning defects detected on a specimen

KLA TENCOR TECH CORP29 citations90

US7142992B1Nov 28, 2006

Flexible hybrid defect classification for semiconductor manufacturing

KLA TENCOR TECH CORP28 citations89

KLA TENCOR TECH CORPORATION

2 patents

US10713771B2Jul 14, 2020

Methods and systems for inspection of wafers and reticles using designer intent data

KLA TENCOR TECH CORPORATION1 citations68

US11348222B2May 31, 2022

Methods and systems for inspection of wafers and reticles using designer intent data

KLA TENCOR TECH CORPORATION0 citations58

VOLK WILLIAM

1 patent

US9002497B2Apr 7, 2015

Methods and systems for inspection of wafers and reticles using designer intent data

VOLK WILLIAM14 citations86

DISHNER MARK

1 patent

US9037280B2May 19, 2015

Computer-implemented methods for performing one or more defect-related functions

DISHNER MARK2 citations51