Inventor

WERTSMAN NADAV

IL4 patents

⚠️ This page may combine multiple inventors who share the name “WERTSMAN NADAV”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ZEISS CARL SMT GMBH

1 patent

US10061192B2Aug 28, 2018

Method and apparatus for correcting errors on a wafer processed by a photolithographic mask

ZEISS CARL SMT GMBH6 citations82

BEYER DIRK

1 patent

US9436080B2Sep 6, 2016

Method and apparatus for correcting errors on a wafer processed by a photolithographic mask

BEYER DIRK9 citations77

WEISS TOMMY

1 patent

US8836780B2Sep 16, 2014

Process control and manufacturing method for fan out wafers

WEISS TOMMY5 citations54

APPLIED MATERIALS ISRAEL LTD

1 patent

US7317523B2Jan 8, 2008

Method for calibrating a metrology tool and a system

APPLIED MATERIALS ISRAEL LTD1 citations49