Inventor
TAKIZAWA SHIGEKI
JP5 patents
Patents
5 patentsUS6275057B1Aug 14, 2001
Semiconductor test system having high frequency and low jitter clock generator
ADVANTEST CORP40 citations88
US7876118B2Jan 25, 2011
Test equipment
ADVANTEST CORP2 citations60
US7802160B2Sep 21, 2010
Test apparatus and calibration method
ADVANTEST CORP3 citations58
US7768255B2Aug 3, 2010
Interconnection substrate, skew measurement method, and test apparatus
ADVANTEST CORP2 citations58
US7350123B2Mar 25, 2008
Test apparatus, correction value managing method, and computer program
ADVANTEST CORP4 citations58