Inventor
AHN SANG-JUNG
KR10 patents
⚠️ This page may combine multiple inventors who share the name “AHN SANG-JUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KOREA RES INST STANDARDS & SCI
4 patentsUS9673035B2Jun 6, 2017
Ion source, and mass analysis apparatus including same
KOREA RES INST STANDARDS & SCI2 citations69
US9425022B2Aug 23, 2016
Monochromator and charged particle apparatus including the same
KOREA RES INST STANDARDS & SCI2 citations59
US10283339B2May 7, 2019
Particle beam mass spectrometer and particle measurement method by means of same
KOREA RES INST STANDARDS & SCI0 citations32
US10312049B2Jun 4, 2019
Sample chamber device for electron microscope, and electron microscope comprising same
KOREA RES INST STANDARDS & SCI0 citations31
KOREA RES INST OF STANDARDS
3 patentsUS7703147B2Apr 20, 2010
Method for fabricating SPM and CD-SPM nanoneedle probe using ion beam and SPM and CD-SPM nanoneedle probe thereby
KOREA RES INST OF STANDARDS6 citations67
US7501618B2Mar 10, 2009
Deformation method of nanometer scale material using particle beam and nano tool thereby
KOREA RES INST OF STANDARDS5 citations60
US8859999B2Oct 14, 2014
Movement-free bending method for one-dimensional or two-dimensional nanostructure using ion beam
KOREA RES INST OF STANDARDS0 citations42