P

Inventor

MENG CHAO-YU

TW14 patents
⚠️ This page may combine multiple inventors who share the name “MENG CHAO-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NOVATEK MICROELECTRONICS CORP

6 patents
US9148594B2Sep 29, 2015

Fixed pattern noise removal method

NOVATEK MICROELECTRONICS CORP4 citations67
US12087079B2Sep 10, 2024

Display apparatus and fingerprint sensing method thereof

NOVATEK MICROELECTRONICS CORP0 citations61
US11854293B2Dec 26, 2023

Display apparatus and fingerprint sensing method thereof

NOVATEK MICROELECTRONICS CORP0 citations61
US10700674B1Jun 30, 2020

Differential comparator circuit

NOVATEK MICROELECTRONICS CORP1 citations61
US9258498B2Feb 9, 2016

Image sensor

NOVATEK MICROELECTRONICS CORP2 citations58
US12250487B2Mar 11, 2025

Image readout device

NOVATEK MICROELECTRONICS CORP0 citations44

TOPPOLY OPTOELECTRONICS CORP

2 patents
US7084652B2Aug 1, 2006

Non-destructive contact test

TOPPOLY OPTOELECTRONICS CORP4 citations58
US7098492B2Aug 29, 2006

Thin film transistor having LDD region and process for producing same

TOPPOLY OPTOELECTRONICS CORP1 citations49

UNIV NAT TAIWAN

1 patent
US7192818B1Mar 20, 2007

Polysilicon thin film fabrication method

UNIV NAT TAIWAN57 citations95

NAT SCIENCE COUNCIL

1 patent
US6375737B2Apr 23, 2002

Method of self-assembly silicon quantum dots

NAT SCIENCE COUNCIL15 citations83

TPO DISPLAYS CORP

1 patent
US7602364B2Oct 13, 2009

Image sticking elimination circuit

TPO DISPLAYS CORP7 citations69

MENG CHAO-YU

1 patent
US8520101B2Aug 27, 2013

Image sensor and black level calibration method thereof

MENG CHAO-YU3 citations54

TPO DISPLAY CORP

1 patent
US7678627B2Mar 16, 2010

Process for producing thin film transistor having LDD region

TPO DISPLAY CORP0 citations48

HSU JER-HAO

1 patent
US8692915B2Apr 8, 2014

Correlated double sampling device of image sensor and method thereof

HSU JER-HAO0 citations33