Inventor
OSTENDORF HANS-CHRISTOPH
DE3 patents
Patents
3 patentsUS6897646B2May 24, 2005
Method for testing wafers to be tested and calibration apparatus
INFINEON TECHNOLOGIES AG11 citations69
US7206985B2Apr 17, 2007
Method and apparatus for calibrating a test system for an integrated semiconductor circuit
INFINEON TECHNOLOGIES AG4 citations55
US7574643B2Aug 11, 2009
Test apparatus and method for testing a circuit unit
INFINEON TECHNOLOGIES AG0 citations43