Inventor
CHUNG HUNG-YI
TW10 patents
⚠️ This page may combine multiple inventors who share the name “CHUNG HUNG-YI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
6 patentsUS11231376B2Jan 25, 2022
Method for semiconductor wafer inspection and system thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US10809635B2Oct 20, 2020
Defect inspection method and defect inspection system
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations65
US12387318B2Aug 12, 2025
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12068207B2Aug 20, 2024
Simultaneous multi-bandwidth optical inspection of semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations58
US11900586B2Feb 13, 2024
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US10872406B2Dec 22, 2020
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48