Inventor
TANAKA TOSHIHISA
JP21 patents
⚠️ This page may combine multiple inventors who share the name “TANAKA TOSHIHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIKON CORP
10 patentsUS10145806B2Dec 4, 2018
X-ray apparatus
NIKON CORP18 citations93
US6101156AAug 8, 2000
Focus control device to perform focus control for a multi-layer recording medium
NIKON CORP33 citations92
US5978328ANov 2, 1999
Focus control device to perform focus control for a multi-layer recording medium
NIKON CORP49 citations92
US5936924AAug 10, 1999
Information recording and reproduction device
NIKON CORP23 citations92
US7359069B2Apr 15, 2008
Polishing pad surface shape measuring instrument, method of using polishing pad surface shape measuring instrument, method of measuring apex angle of cone of polishing pad, method of measuring depth of groove of polishing pad, CMP polisher, and method of manufacturing semiconductor device
NIKON CORP18 citations91
US5831964ANov 3, 1998
Recording medium having first tracks and second tracks at different levels and with different recording formats
NIKON CORP14 citations73
US9529209B2Dec 27, 2016
Blur compensation device, lens barrel, and camera device
NIKON CORP1 citations52
US5856957AJan 5, 1999
Magnetic field applying device
NIKON CORP1 citations51
US7486407B2Feb 3, 2009
Polishing pad surface shape measuring instrument, method of using polishing pad surface shape measuring instrument, method of measuring apex angle of cone of polishing pad, method of measuring depth of groove of polishing pad, CMP polisher, and method of manufacturing semiconductor device
NIKON CORP1 citations50
US10571412B2Feb 25, 2020
X-ray apparatus and structure production method
NIKON CORP0 citations47
SYSMEX CORP
3 patentsUS11422072B2Aug 23, 2022
Specimen smearing apparatus, specimen smearing method, smear sample preparing apparatus, and smear sample preparing method
SYSMEX CORP0 citations61
US10801929B2Oct 13, 2020
Specimen smearing apparatus, specimen smearing method, smear sample preparing apparatus, and smear sample preparing method
SYSMEX CORP1 citations61
US9720009B2Aug 1, 2017
Sample processing apparatus, sample rack set, and sample processing method
SYSMEX CORP1 citations51