Inventor

PARK IL-SUK

KR2 patents

Patents

2 patents

US9727799B2Aug 8, 2017

Method of automatic defect classification

SAMSUNG ELECTRONICS CO LTD2 citations68

US9831137B2Nov 28, 2017

Defect imaging apparatus, defect detection system having the same, and method of detecting defects using the same

SAMSUNG ELECTRONICS CO LTD0 citations34