Inventor

DE GROOT PETER

US69 patents

⚠️ This page may combine multiple inventors who share the name “DE GROOT PETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DE GROOT PETER

ZYGO CORP

Single-pass and multi-pass interferometery systems having a dynamic beam-steering assembly for measuring distance, angle, and dispersion

Grazing incidence interferometer and method

Infrared scanning interferometry apparatus and method

Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms

Interferometer for determining characteristics of an object surface, including processing and calibration

Interferometer having a dynamic beam steering assembly

Apparatus and method for measuring the refractive index and optical path length effects of air using multiple-pass interferometry

Method and apparatus for profiling surfaces using diffracative optics

Homodyne interferometric receiver and calibration method having improved accuracy and functionality

Interferometer with multiple modes of operation for determining characteristics of an object surface

Interferometer for determining characteristics of an object surface

Interferometer and method for measuring characteristics of optically unresolved surface features

Optical systems for measuring form and geometric dimensions of precision engineered parts

Interferometer and method for measuring the refractive index and optical path length effects of air

Interferometer and method for measuring the refractive index and optical path length effects of air

Interferometer and method for measuring the refractive index and optical path length effects of air

Apparatus to transform two nonparallel propagating optical beam components into two orthogonally polarized beam components

Superheterodyne interferometer and method for compensating the refractive index of air using electronic frequency multiplication

Method and apparatus for measuring and compensating birefringence in rotating disks

Methods and apparatus for profiling surfaces of transparent objects

Phase shifting interferometer and method for surface topography measurement

Error compensation in phase shifting interferometry

Interferometry for determining characteristics of an object surface, with spatially coherent illumination

Multiple-angle multiple-wavelength interferometer using high-NA imaging and spectral analysis

Interferometry method and system including spectral decomposition

Method and system for analyzing low-coherence interferometry signals for information about thin film structures

Single-pass and multi-pass interferometry systems having a dynamic beam-steering assembly for measuring distance, angle, and dispersion

Geometrically-Desensitized interferometer with adjustable range of measurement depths

Method and apparatus for performing interferometric measurements with reduced sensitivity to vibration

Full-field geometrically-desensitized interferometer employing diffractive and conventional optics

Optical gap measuring apparatus and method

Optical gap measuring apparatus and method

Interferometer and method for measuring the distance of an object surface with respect to the surface of a rotating disk

Method for profiling an object surface using a large equivalent wavelength and system therefor

Optical gap measuring apparatus and method

Fiber-based interferometer system for monitoring an imaging interferometer

Compound reference interferometer

Interferometer and method for measuring characteristics of optically unresolved surface features

Apparatus and method for measuring characteristics of surface features

Interferometer and method for measuring characteristics of optically unresolved surface features

Interferometer and method for measuring the refractive index and optical path length effects of air

Interferometer and method for measuring the refractive index and optical path length effects of air

Interferometer system for monitoring an object

Scan error correction in low coherence scanning interferometry

DE GROOT PETER

Analyzing surface structure using scanning interferometry

Topographical profiling with coherence scanning interferometry

Interferometric analysis of under-resolved features

HUGHES DANBURY OPTICAL SYST

Laser diode radar with extended range

PERKIN ELMER CORP

Multimode laser diode system for range measurement

SECO PACKING

Leafy vegetable harvester and method