Inventor
ADLER FRANK
US13 patents
⚠️ This page may combine multiple inventors who share the name “ADLER FRANK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
6 patentsUS7124336B2Oct 17, 2006
Method for the defect analysis of memory modules
INFINEON TECHNOLOGIES AG11 citations83
US7165002B2Jan 16, 2007
Test device for dynamic memory modules
INFINEON TECHNOLOGIES AG7 citations73
US6683009B2Jan 27, 2004
Method for local etching
INFINEON TECHNOLOGIES AG10 citations72
US6781398B2Aug 24, 2004
Circuit for testing an integrated circuit
INFINEON TECHNOLOGIES AG10 citations70
US6836440B2Dec 28, 2004
Method of checking electrical connections between a memory module and a semiconductor memory chip
INFINEON TECHNOLOGIES AG5 citations62
US6703844B2Mar 9, 2004
Method for determining the transit time of electrical signals on printed circuit boards using automatic standard test equipment
INFINEON TECHNOLOGIES AG4 citations62