Inventor

HUANG HUAPENG

US5 patents

⚠️ This page may combine multiple inventors who share the name “HUANG HUAPENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

X RAY OPTICAL SYS INC

1 patent

US7711088B2May 4, 2010

Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface

X RAY OPTICAL SYS INC10 citations79

GIBSON DAVID M

1 patent

US7236566B2Jun 26, 2007

In-situ X-ray diffraction system using sources and detectors at fixed angular positions

GIBSON DAVID M14 citations77

UNIV MARYLAND

1 patent

US11933747B2Mar 19, 2024

System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects

UNIV MARYLAND1 citations48

HUANG HUAPENG

1 patent

US8130908B2Mar 6, 2012

X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic

HUANG HUAPENG2 citations45

REEVES JODI LYNN

1 patent

US8647705B2Feb 11, 2014

Methods for forming superconductor articles and XRD methods for characterizing same

REEVES JODI LYNN1 citations41