Inventor
LIN CHIH-HSUN
TW57 patents
⚠️ This page may combine multiple inventors who share the name “LIN CHIH-HSUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
9 patentsUS8709901B1Apr 29, 2014
Method of forming an isolation structure
UNITED MICROELECTRONICS CORP26 citations92
US9966263B1May 8, 2018
Method of fabricating fin structure
UNITED MICROELECTRONICS CORP3 citations72
US9012300B2Apr 21, 2015
Manufacturing method for a shallow trench isolation
UNITED MICROELECTRONICS CORP2 citations61
US9466535B2Oct 11, 2016
Method of forming target patterns
UNITED MICROELECTRONICS CORP0 citations52
US9673053B2Jun 6, 2017
Method for fabricating semiconductor device
UNITED MICROELECTRONICS CORP1 citations51
US9299600B2Mar 29, 2016
Method for repairing an oxide layer and method for manufacturing a semiconductor structure applying the same
UNITED MICROELECTRONICS CORP0 citations51
US8940600B2Jan 27, 2015
Method for fabricating semiconductor device
UNITED MICROELECTRONICS CORP0 citations51
US9443726B1Sep 13, 2016
Semiconductor process
UNITED MICROELECTRONICS CORP1 citations50
US9972498B2May 15, 2018
Method of fabricating a gate cap layer
UNITED MICROELECTRONICS CORP0 citations41
TAIWAN SEMICONDUCTOR MFG CO LTD
9 patentsUS10699960B2Jun 30, 2020
Methods for improving interlayer dielectric layer topography
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations82
US11430733B2Aug 30, 2022
Method of testing wafer
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10818595B2Oct 27, 2020
Semiconductor structure, testing and fabricating methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US12009302B2Jun 11, 2024
Method of testing wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11257719B2Feb 22, 2022
Methods for improving interlayer dielectric layer topography
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10672777B2Jun 2, 2020
Method of manufacturing semiconductor device having multi-height structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10211214B2Feb 19, 2019
Semiconductor device having milti-height structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9978604B2May 22, 2018
Salicide formation using a cap layer
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations51
US10037927B2Jul 31, 2018
Semiconductor structure, testing and fabricating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
TAIWAN SEMICONDUCTOR MFG
7 patentsUS8775982B2Jul 8, 2014
Optical proximity correction for active region design layout
TAIWAN SEMICONDUCTOR MFG2 citations60
US8741732B2Jun 3, 2014
Forming metal-insulator-metal capacitors over a top metal layer
TAIWAN SEMICONDUCTOR MFG3 citations60
US9209270B2Dec 8, 2015
MOS devices having non-uniform stressor doping
TAIWAN SEMICONDUCTOR MFG0 citations51
US9024391B2May 5, 2015
Semiconductor structure having stressor
TAIWAN SEMICONDUCTOR MFG0 citations51
US8836088B2Sep 16, 2014
Semiconductor structure having etch stop layer
TAIWAN SEMICONDUCTOR MFG0 citations51
US8765545B2Jul 1, 2014
Method of manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG1 citations51
US7846832B2Dec 7, 2010
Semiconductor device and fabrication method thereof
TAIWAN SEMICONDUCTOR MFG0 citations45
LIN MEI-HSUAN
6 patentsUS8533639B2Sep 10, 2013
Optical proximity correction for active region design layout
LIN MEI-HSUAN7 citations81
US8994097B2Mar 31, 2015
MOS devices having non-uniform stressor doping
LIN MEI-HSUAN2 citations61
US8513143B2Aug 20, 2013
Semiconductor structure and method of manufacturing
LIN MEI-HSUAN2 citations61
US9343318B2May 17, 2016
Salicide formation using a cap layer
LIN MEI-HSUAN0 citations51
US8846492B2Sep 30, 2014
Integrated circuit having a stressor and method of forming the same
LIN MEI-HSUAN0 citations51
US8470660B2Jun 25, 2013
Method of manufacturing a semiconductor device
LIN MEI-HSUAN1 citations51
LIN CHIH-HSUN
3 patentsHSU CHUN-WEI
2 patentsWU KUN-MAO
1 patentKUO PO-HSUAN
1 patentCHEN WEI CHENG
1 patentWANG YU-REN
1 patentHWANG CHING-BAI
1 patentPRIMAX ELECTRONICS LTD
1 patentLEE SHIH-CHANG
1 patentMSTAR SEMICONDUCTOR INC
1 patentACADEMIA SINICA
1 patentHUANG PO-CHENG
1 patentDAXON TECHNOLOGY INC
1 patentLAI SZU-HAO
1 patentBENQ MATERIALS CORP
1 patentWONDERLAND SWITZERLAND AG
1 patentShowing the top 50 of 57 patents by PatentIndex Score.