Inventor
YANG JIUNN-DER
TW5 patents
Patents
5 patentsUS6017771AJan 25, 2000
Method and system for yield loss analysis by yield management system
TAIWAN SEMICONDUCTOR MFG80 citations94
US6389323B1May 14, 2002
Method and system for yield loss analysis by yield management system
TAIWAN SEMICONDUCTOR MFG26 citations90
US6211083B1Apr 3, 2001
Use of a novel capped anneal procedure to improve salicide formation
TAIWAN SEMICONDUCTOR MFG26 citations89
US6727155B1Apr 27, 2004
Method for spin etching sidewall spacers by acid vapor
TAIWAN SEMICONDUCTOR MFG17 citations79
US6373576B1Apr 16, 2002
Method for measuring concentrations of dopants in a liquid carrier on a wafer surface
TAIWAN SEMICONDUCTOR MFG3 citations60